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Title: Ultra-high-resolution inelastic X-ray scattering at high-repetition-rate self-seeded X-ray free-electron lasers

Inelastic X-ray scattering (IXS) is an important tool for studies of equilibrium dynamics in condensed matter. A new spectrometer recently proposed for ultra-high-resolution IXS (UHRIX) has achieved 0.6 meV and 0.25 nm₋1spectral and momentum-transfer resolutions, respectively. However, further improvements down to 0.1 meV and 0.02 nm₋1are required to close the gap in energy–momentum space between high- and low-frequency probes. It is shown that this goal can be achieved by further optimizing the X-ray optics and by increasing the spectral flux of the incident X-ray pulses. UHRIX performs best at energies from 5 to 10 keV, where a combination of self-seeding and undulator tapering at the SASE-2 beamline of the European XFEL promises up to a 100-fold increase in average spectral flux compared with nominal SASE pulses at saturation, or three orders of magnitude more than what is possible with storage-ring-based radiation sources. Wave-optics calculations show that about 7 × 1012 photons s₋1in a 90 µeV bandwidth can be achieved on the sample. Ultimately, this will provide unique new possibilities for dynamics studies by IXS.
 [1] ;  [2] ;  [3] ;  [2] ;  [3] ;  [3] ;  [4] ;  [5]
  1. Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source II (NSLS-II)
  2. European X-ray Free-Electron Laser (XFEL), Hamburg (Germany)
  3. Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany)
  4. Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
  5. Science and Technology Facilities Council (STFC), Harwell Campus, Oxford (United Kingdom). Diamond Light Source, Ltd.
Publication Date:
OSTI Identifier:
Grant/Contract Number:
AC02-06CH11357; SC0006284; SC0011237
Accepted Manuscript
Journal Name:
Journal of Synchrotron Radiation (Online)
Additional Journal Information:
Journal Name: Journal of Synchrotron Radiation (Online); Journal Volume: 23; Journal Issue: 2; Journal ID: ISSN 1600-5775
International Union of Crystallography
Research Org:
Argonne National Laboratory (ANL), Argonne, IL (United States)
Sponsoring Org:
USDOE Office of Science - Office of Basic Energy Sciences; U.S. Department of Energy (Office not specified)
Country of Publication:
United States
47 OTHER INSTRUMENTATION inelastic X-ray scattering; X-ray free-electron laser; X-ray optics