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This content will become publicly available on February 1, 2017

Title: System-independent characterization of materials using dual-energy computed tomography

In this study, we present a new decomposition approach for dual-energy computed tomography (DECT) called SIRZ that provides precise and accurate material description, independent of the scanner, over diagnostic energy ranges (30 to 200 keV). System independence is achieved by explicitly including a scanner-specific spectral description in the decomposition method, and a new X-ray-relevant feature space. The feature space consists of electron density, ρe, and a new effective atomic number, Ze, which is based on published X-ray cross sections. Reference materials are used in conjunction with the system spectral response so that additional beam-hardening correction is not necessary. The technique is tested against other methods on DECT data of known specimens scanned by diverse spectra and systems. Uncertainties in accuracy and precision are less than 3% and 2% respectively for the (ρe, Ze) results compared to prior methods that are inaccurate and imprecise (over 9%).
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  1. Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Publication Date:
OSTI Identifier:
Report Number(s):
Journal ID: ISSN 0018-9499
Grant/Contract Number:
Accepted Manuscript
Journal Name:
IEEE Transactions on Nuclear Science
Additional Journal Information:
Journal Volume: 63; Journal Issue: 1; Journal ID: ISSN 0018-9499
Institute of Electrical and Electronics Engineers (IEEE)
Research Org:
Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
Sponsoring Org:
Country of Publication:
United States
42 ENGINEERING; 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; 62 RADIOLOGY AND NUCLEAR MEDICINE beam-hardening correction; effective atomic number; electron density; dual-energy computed tomography; quantitative X-ray characterization; photoelectric-compton decomposition; system-independent CT