Three-dimensional interaction force and tunneling current spectroscopy of point defects on rutile TiO2(110)

Baykara, Mehmet Z.; Mönig, Harry; Schwendemann, Todd C.; Ünverdi, Özhan; Altman, Eric I.; Schwarz, Udo D.

doi:10.1063/1.4942100

Title: Three-dimensional interaction force and tunneling current spectroscopy of point defects on rutile TiO₂(110)

Journal Article · Mon Feb 15 00:00:00 EST 2016 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4942100· OSTI ID:1469684

Baykara, Mehmet Z. ^[1]; Mönig, Harry ^[2]; Schwendemann, Todd C. ^[3]; Ünverdi, Özhan ^[4]; Altman, Eric I. ^[5]; Schwarz, Udo D. ^[5]

Yale Univ., New Haven, CT (United States); Bilkent Univ., Ankara (Turkey)
Yale Univ., New Haven, CT (United States); Univ. of Munster, Munster (Germany)
Yale Univ., New Haven, CT (United States); Southern Connecticut State Univ., New Haven, CT (United States)
Yale Univ., New Haven, CT (United States); Yasar Univ., Izmir (Turkey)
Yale Univ., New Haven, CT (United States)

Here, the extent to which point defects affect the local chemical reactivity and electronic properties of an oxide surface was evaluated with picometer resolution in all three spatial dimensions using simultaneous atomic force/scanning tunneling microscopy measurements performed on the (110) face of rutile TiO₂. Oxygen atoms were imaged as protrusions in both data channels, corresponding to a rarely observed imaging mode for this prototypical metal oxide surface. Three-dimensional spectroscopy of interaction forces and tunneling currents was performed on individual surface and subsurface defects as a function of tip-sample distance. An interstitial defect assigned to a subsurface hydrogen atom is found to have a distinct effect on the local density of electronic states on the surface, but no detectable influence on the tip-sample interaction force. Meanwhile, spectroscopic data acquired on an oxygen vacancy highlight the role of the probe tip in chemical reactivity measurements.

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Research Organization:: Yale Univ., New Haven, CT (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: FG02-06ER15834

OSTI ID:: 1469684

Alternate ID(s):: OSTI ID: 1238076

Journal Information:: Applied Physics Letters, Vol. 108, Issue 7; ISSN 0003-6951

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 18 works

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References (21)

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Length Scale and Dimensionality of Defects in Epitaxial SnTe Topological Crystalline Insulator Films Dagdeviren, Omur E.; Zhou, Chao; Zou, Ke Advanced Materials Interfaces, Vol. 4, Issue 2 https://doi.org/10.1002/admi.201601011	journal	January 2017
Direct observation of atomic step edges on the rutile TiO ₂ (110)-(1 × 1) surface using atomic force microscopy Wen, Huan Fei; Miyazaki, Masato; Zhang, Quanzhen Physical Chemistry Chemical Physics, Vol. 20, Issue 44 https://doi.org/10.1039/c8cp06156d	journal	January 2018
The qPlus sensor, a powerful core for the atomic force microscope Giessibl, Franz J. Review of Scientific Instruments, Vol. 90, Issue 1 https://doi.org/10.1063/1.5052264	journal	January 2019
Imaging patterns of anatase TiO ₂ (001) with non-contact atomic force microscopy Katsube, Daiki; Abe, Masayuki Nanotechnology, Vol. 30, Issue 21 https://doi.org/10.1088/1361-6528/ab02a7	journal	March 2019

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