Relationships between residual stress, microstructure and mechanical properties of electron beam–physical vapor deposition thermal barrier coatings
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October 1998 |
Microstructures and textures of pure magnesium deformed in plane-strain compression
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November 2004 |
The use of full-field measurement methods in composite material characterization: interest and limitations
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July 2004 |
Shearography: An optical measurement technique and applications
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April 2005 |
Overview of Identification Methods of Mechanical Parameters Based on Full-field Measurements
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July 2008 |
Non-contact technique for characterizing full-field surface deformation of shape memory polymers at elevated and room temperatures
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February 2011 |
Two-dimensional digital image correlation for in-plane displacement and strain measurement: a review
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April 2009 |
Digital Imaging Techniques In Experimental Stress Analysis
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June 1982 |
Application of an optimized digital correlation method to planar deformation analysis
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August 1986 |
Velocity field of the “La Clapière” landslide measured by the correlation of aerial and QuickBird satellite images
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January 2004 |
Digital Image Correlation for Improved Detection of Basal Cell Carcinoma
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January 2010 |
A new microtensile tester for the study of MEMS materials with the aid of atomic force microscopy
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March 2002 |
Mechanical measurements at the micron and nanometer scales
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March 2003 |
Mechanics of Thin Films and Microdevices
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June 2004 |
Young's modulus, Poisson's ratio and failure properties of tetrahedral amorphous diamond-like carbon for MEMS devices
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February 2005 |
Measurement of nanodisplacements and elastic properties of MEMS via the microscopic hole method
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April 2005 |
Nanoscale in-plane displacement evaluation by AFM scanning and digital image correlation processing
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February 2005 |
AFM image reconstruction for deformation measurements by digital image correlation
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January 2006 |
Elastic Properties and Representative Volume Element of Polycrystalline Silicon for MEMS
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December 2006 |
In Situ Nanoscale In-Plane Deformation Studies of Ultrathin Polymeric Films During Tensile Deformation Using Atomic Force Microscopy and Digital Image Correlation Techniques
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January 2007 |
Nanoscale deformation measurement of microscale interconnection assemblies by a digital image correlation technique
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September 2007 |
Submicron deformation field measurements: Part 1. Developing a digital scanning tunneling microscope
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March 1998 |
Submicron deformation field measurements: Part 2. Improved digital image correlation
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June 1998 |
Submicron deformation field measurements: Part 3. Demonstration of deformation determinations
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September 1998 |
Microscopic Strain Mapping Using Scanning Electron Microscopy Topography Image Correlation at Large Strain
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August 2005 |
Measurement of residual stresses in micromachined structures in a microregion
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February 2006 |
In-plane strain measurements on a microscopic scale by coupling digital image correlation and an in situ SEM technique
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January 2006 |
Metrology in a scanning electron microscope: theoretical developments and experimental validation
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August 2006 |
Scanning Electron Microscopy for Quantitative Small and Large Deformation Measurements Part I: SEM Imaging at Magnifications from 200 to 10,000
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March 2007 |
Scanning Electron Microscopy for Quantitative Small and Large Deformation Measurements Part II: Experimental Validation for Magnifications from 200 to 10,000
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March 2007 |
Digital Image Correlation under Scanning Electron Microscopy: Methodology and Validation
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July 2013 |
Self-Assembled Nanoparticle Surface Patterning for Improved Digital Image Correlation in a Scanning Electron Microscope
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March 2013 |
SEM-DIC Based Nanoscale Thermal Deformation Studies of Heterogeneous Material
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August 2013 |
Micro-scale deformation measurement using the digital image correlation technique and scanning electron microscope imaging
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August 2008 |
Microstructure-Dependent Local Strain Behavior in Polycrystals through In-Situ Scanning Electron Microscope Tensile Experiments
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August 2009 |
Residual Stress Measurement on a MEMS Structure With High-Spatial Resolution
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April 2007 |
Transmission Electron Microscopy of Shape-Controlled Nanocrystals and Their Assemblies
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February 2000 |
Transmission Electron Microscopy
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January 2009 |
Quantitative measurement of displacement and strain fields from HREM micrographs
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August 1998 |
Quantitative analysis of strain field in thin films from HRTEM micrographs
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April 1998 |
Nanoscale holographic interferometry for strain measurements in electronic devices
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June 2008 |
Direct strain measurement in a 65nm node strained silicon transistor by convergent-beam electron diffraction
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October 2006 |
Higher Order Laue Zone Effects in Electron Diffraction and their Use in Lattice Parameter Determination
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May 1977 |
Application of convergent beam electron diffraction to two-dimensional strain mapping in silicon devices
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March 2003 |
Strain characterization in SOI and strained-Si on SGOI MOSFET channel using nano-beam electron diffraction (NBD)
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December 2005 |
Evaluation of two-dimensional strain distribution by STEM/NBD
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July 2011 |
Structure, electrical and magnetic properties, and the origin of the room temperature ferromagnetism in Mn-implanted Si
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October 2009 |
Two-Phase Electrochemical Lithiation in Amorphous Silicon
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January 2013 |
Determination of displacements using an improved digital correlation method
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August 1983 |
Deformation measurements by digital image correlation: Implementation of a second-order displacement gradient
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Assessment of Digital Image Correlation Measurement Errors: Methodology and Results
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December 2008 |
Digital image correlation using Newton-Raphson method of partial differential correction
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September 1989 |
Finite element formulation for a digital image correlation method
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January 2005 |
“Finite-Element” Displacement Fields Analysis from Digital Images: Application to Portevin–Le Châtelier Bands
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December 2006 |
Hybrid analytical and extended finite element method (HAX-FEM): A new enrichment procedure for cracked solids: HAX-FEM: A NEW ENRICHMENT PROCEDURE FOR CRACKED SOLIDS
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July 2009 |
Mixed-mode crack propagation using a Hybrid Analytical and eXtended Finite Element Method
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March 2010 |
Comparison of Local and Global Approaches to Digital Image Correlation
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March 2012 |
Comparison of Subset-Based Local and Finite Element-Based Global Digital Image Correlation
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February 2015 |
Room design for high-performance electron microscopy
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October 2006 |
Convergence Properties of the Nelder--Mead Simplex Method in Low Dimensions
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January 1998 |
Reaction of Li with Alloy Thin Films Studied by In Situ AFM
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January 2003 |
Shape evolution of patterned amorphous and polycrystalline silicon microarray thin film electrodes caused by lithium insertion and extraction
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October 2012 |
In Situ Atomic Force Microscopy of Lithiation and Delithiation of Silicon Nanostructures for Lithium Ion Batteries
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September 2013 |
Structural study of a -Si and a -Si:H films by EXAFS and Raman-scattering spectroscopy
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October 1994 |
Structure of evaporated pure amorphous silicon: Neutron-diffraction and reverse Monte Carlo investigations
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September 1993 |