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Title: Nanoscale deformation analysis with high-resolution transmission electron microscopy and digital image correlation

We present an application of the digital image correlation (DIC) method to high-resolution transmission electron microscopy (HRTEM) images for nanoscale deformation analysis. The combination of DIC and HRTEM offers both the ultrahigh spatial resolution and high displacement detection sensitivity that are not possible with other microscope-based DIC techniques. We demonstrate the accuracy and utility of the HRTEM-DIC technique through displacement and strain analysis on amorphous silicon. Two types of error sources resulting from the transmission electron microscopy (TEM) image noise and electromagnetic-lens distortions are quantitatively investigated via rigid-body translation experiments. The local and global DIC approaches are applied for the analysis of diffusion- and reaction-induced deformation fields in electrochemically lithiated amorphous silicon. As a result, the DIC technique coupled with HRTEM provides a new avenue for the deformation analysis of materials at the nanometer length scales.
 [1] ;  [1] ;  [1] ;  [2] ;  [3] ;  [2] ;  [1] ;  [1]
  1. Georgia Inst. of Technology, Atlanta, GA (United States)
  2. Univ. of Pittsburgh, Pittsburgh, PA (United States)
  3. Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Publication Date:
OSTI Identifier:
Report Number(s):
Journal ID: ISSN 0021-8936; 594412
Grant/Contract Number:
Accepted Manuscript
Journal Name:
Journal of Applied Mechanics
Additional Journal Information:
Journal Volume: 82; Journal Issue: 12; Journal ID: ISSN 0021-8936
Research Org:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org:
USDOE National Nuclear Security Administration (NNSA)
Country of Publication:
United States
77 NANOSCIENCE AND NANOTECHNOLOGY deformation; resolution (optics); nanoscale phenomena; displacement; errors; transmission electron microscopy; noise (sound); lenses (optics)