Imaging local electric fields produced upon synchrotron X-ray exposure

Dettmar, Christopher M.; Newman, Justin A.; Toth, Scott J.; Becker, Michael; Fischetti, Robert F.; Simpson, Garth J.

doi:10.1073/pnas.1407771112

Title: Imaging local electric fields produced upon synchrotron X-ray exposure

Journal Article · Wed Dec 31 00:00:00 EST 2014 · Proceedings of the National Academy of Sciences of the United States of America

DOI:https://doi.org/10.1073/pnas.1407771112· OSTI ID:1235100

Dettmar, Christopher M. ^[1]; Newman, Justin A. ^[1]; Toth, Scott J. ^[1]; Becker, Michael ^[2]; Fischetti, Robert F. ^[2]; Simpson, Garth J. ^[1]

Department of Chemistry, Purdue University, West Lafayette, IN 47907, and
The General Medical Sciences and Cancer Institutes Structural Biology Facility at Advanced Photon Source, Argonne National Laboratory, Lemont, IL 60439

Electron–hole separation following hard X-ray absorption during diffraction analysis of soft materials under cryogenic conditions produces substantial local electric fields visualizable by second harmonic generation (SHG) microscopy. Monte Carlo simulations of X-ray photoelectron trajectories suggest the formation of substantial local electric fields in the regions adjacent to those exposed to X-rays, indicating a possible electric-field–induced SHG (EFISH) mechanism for generating the observed signal. In studies of amorphous vitreous solvents, analysis of the SHG spatial profiles following X-ray microbeam exposure was consistent with an EFISH mechanism. Within protein crystals, exposure to 12-keV (1.033-Å) X-rays resulted in increased SHG in the region extending ~3 μm beyond the borders of the X-ray beam. Moderate X-ray exposures typical of those used for crystal centering by raster scanning through an X-ray beam were sufficient to produce static electric fields easily detectable by SHG. The X-ray–induced SHG activity was observed with no measurable loss for longer than 2 wk while maintained under cryogenic conditions, but disappeared if annealed to room temperature for a few seconds. In conclusion, these results provide direct experimental observables capable of validating simulations of X-ray–induced damage within soft materials. Additionally, X-ray–induced local fields may potentially impact diffraction resolution through localized piezoelectric distortions of the lattice.

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Research Organization:: Energy Frontier Research Centers (EFRC) (United States). Center for Direct Catalytic Conversion of Biomass to Biofuels (C3Bio)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES); US National Institutes of Health (NIH)

Contributing Organization:: C3Bio partners with Purdue University (lead); Argonne National Laboratory; National Renewable Energy Laboratory; Northeastern University; University of Tennessee

Grant/Contract Number:: AC02-06CH11357; SC0000997; NIH-R01GM103401; NIH-R01GM103910

OSTI ID:: 1235100

Alternate ID(s):: OSTI ID: 1210418

Journal Information:: Proceedings of the National Academy of Sciences of the United States of America, Journal Name: Proceedings of the National Academy of Sciences of the United States of America Vol. 112 Journal Issue: 3; ISSN 0027-8424

Publisher:: Proceedings of the National Academy of SciencesCopyright Statement

Country of Publication:: United States

Language:: English

Citation Metrics:

Cited by: 8 works

Citation information provided by
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References (28)

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72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS
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