Synchrotron-based X-ray computed tomography during compression loading of cellular materials

Journal Article · Wed Apr 29 00:00:00 EDT 2015 · Microscopy Today

DOI:https://doi.org/10.1017/S155192951500019X· OSTI ID:1233284

Cordes, Nikolaus L. ^[1]; Henderson, Kevin ^[1]; Stannard, Tyler ^[2]; Williams, Jason J. ^[2]; Xiao, Xianghui ^[3]; Robinson, Mathew W. C. ^[4]; Schaedler, Tobias A. ^[5]; Chawla, Nikhilesh ^[2]; Patterson, Brian M. ^[1]

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1. Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
2. Arizona State Univ., Tempe, AZ (United States)
3. Argonne National Lab. (ANL), Argonne, IL (United States)
4. Atomic Weapons Establishment (AWE), Berkshire (United Kingdom)
5. HRL Lab. LLC, Malibu, CA (United States)

Three-dimensional X-ray computed tomography (CT) of in situ dynamic processes provides internal snapshot images as a function of time. Tomograms are mathematically reconstructed from a series of radiographs taken in rapid succession as the specimen is rotated in small angular increments. In addition to spatial resolution, temporal resolution is important. Thus temporal resolution indicates how close together in time two distinct tomograms can be acquired. Tomograms taken in rapid succession allow detailed analyses of internal processes that cannot be obtained by other means. This article describes the state-of-the-art for such measurements acquired using synchrotron radiation as the X-ray source.

• Research Organization: Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
• Sponsoring Organization: USDOE
• Grant/Contract Number: AC52-06NA25396
• OSTI ID: 1233284
• Report Number(s): LA-UR-14-29587; applab; PII: S155192951500019X
• Journal Information: Microscopy Today, Vol. 23, Issue 03; ISSN 1551-9295
• Country of Publication: United States
• Language: English

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36 MATERIALS SCIENCE