A Method to Determine Fault Vectors in 4H-SiC From Stacking Sequences Observed on High Resolution Transmission Electron Microscopy Images
Journal Article
·
· Journal of Applied Physics
- Research Organization:
- Brookhaven National Lab. (BNL), Upton, NY (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- DOE Contract Number:
- SC00112704
- OSTI ID:
- 1228884
- Report Number(s):
- BNL-110959-2015-JA
- Journal Information:
- Journal of Applied Physics, Vol. 116, Issue 10; ISSN 0021-8979
- Publisher:
- American Institute of Physics (AIP)
- Country of Publication:
- United States
- Language:
- English
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Erratum: “A method to determine fault vectors in 4H-SiC from stacking sequences observed on high resolution transmission electron microscopy images” [J. Appl. Phys. 116, 104905 (2014)]
A method to determine fault vectors in 4H-SiC from stacking sequences observed on high resolution transmission electron microscopy images
A method to determine fault vectors in 4H-SiC from stacking sequences observed on high resolution transmission electron microscopy images
Journal Article
·
Tue Oct 28 00:00:00 EDT 2014
· Journal of Applied Physics
·
OSTI ID:1228884
+10 more
A method to determine fault vectors in 4H-SiC from stacking sequences observed on high resolution transmission electron microscopy images
Journal Article
·
Sun Sep 14 00:00:00 EDT 2014
· Journal of Applied Physics
·
OSTI ID:1228884
+10 more
A method to determine fault vectors in 4H-SiC from stacking sequences observed on high resolution transmission electron microscopy images
Journal Article
·
Sun Sep 14 00:00:00 EDT 2014
· Journal of Applied Physics
·
OSTI ID:1228884
+10 more