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Title: Empirical correlations between the arrhenius' parameters of impurities' diffusion coefficients in CdTe crystals

Journal Article · · Journal of Phase Equilibria and Diffusion
 [1];  [1];  [1];  [2];  [1]
  1. Chernivtsy National Univ., Chernivtsi (Ukraine)
  2. Brookhaven National Lab. (BNL), Upton, NY (United States)

Understanding of self- and dopant-diffusion in semiconductor devices is essential to our being able to assure the formation of well-defined doped regions. In this paper, we compare obtained in the literature up to date the Arrhenius’ parameters (D=D0exp(–ΔEa/kT)) of point-defect diffusion coefficients and the I-VII groups impurities in CdTe crystals and films. We found that in the diffusion process there was a linear dependence between the pre-exponential factor, D0, and the activation energy, ΔEa, of different species: This was evident in the self-diffusivity and isovalent impurity Hg diffusivity as well as for the dominant IIIA and IVA groups impurities and Chlorine, except for the fast diffusing elements (e.g., Cu and Ag), chalcogens O, S, and Se, halogens I and Br as well as the transit impurities Mn, Co, Fe. As a result, reasons of the lack of correspondence of the data to compensative dependence are discussed.

Research Organization:
Brookhaven National Laboratory (BNL), Upton, NY (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA), Office of Nonproliferation and Verification Research and Development (NA-22)
Grant/Contract Number:
SC00112704
OSTI ID:
1228825
Report Number(s):
BNL-108079-2015-JA; NN2001
Journal Information:
Journal of Phase Equilibria and Diffusion, Vol. 36, Issue 2; ISSN 1547-7037
Publisher:
ASM InternationalCopyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 12 works
Citation information provided by
Web of Science

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Modeling the evolved microstructure of cement pastes governed by diffusion through barrier shells of C–S–H journal December 2018

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