Nanorheology by atomic force microscopy

Li, Tai-De; Chiu, Hsiang-Chih; Ortiz-Young, Deborah; Riedo, Elisa

doi:10.1063/1.4903353

Title: Nanorheology by atomic force microscopy

Journal Article · Fri Dec 19 00:00:00 EST 2014 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.4903353· OSTI ID:1226623

Li, Tai-De ^[1]; Chiu, Hsiang-Chih ^[1]; Ortiz-Young, Deborah ^[1]; Riedo, Elisa ^[1]

School of Physics, Georgia Institute of Technology, Atlanta, Georgia 30332, USA

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Sponsoring Organization:: USDOE

Grant/Contract Number:: FG02-06ER46293

OSTI ID:: 1226623

Journal Information:: Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Vol. 85 Journal Issue: 12; ISSN 0034-6748

Publisher:: American Institute of PhysicsCopyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 20 works

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References (28)

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Structured and viscous water in subnanometer gaps Li, Tai-De; Gao, Jianping; Szoszkiewicz, Robert Physical Review B, Vol. 75, Issue 11 https://doi.org/10.1103/PhysRevB.75.115415	journal	March 2007
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