X-ray Moiré deflectometry using synthetic reference images
- Johns Hopkins Univ., Baltimore, MD (United States)
Moiré fringe deflectometry with grating interferometers is a technique that enables refraction-based x-ray imaging using a single exposure of an object. To obtain the refraction image, the method requires a reference fringe pattern (without the object). Our study shows that, in order to avoid artifacts, the reference pattern must be exactly matched in phase with the object fringe pattern. In experiments, however, it is difficult to produce a perfectly matched reference pattern due to unavoidable interferometer drifts. We present a simple method to obtain matched reference patterns using a phase-scan procedure to generate synthetic Moiré images. As a result, the method will enable deflectometric diagnostics of transient phenomena such as laser-produced plasmas and could improve the sensitivity and accuracy of medical phase-contrast imaging.
- Research Organization:
- Johns Hopkins Univ., Baltimore, MD (United States)
- Sponsoring Organization:
- USDOE National Nuclear Security Administration (NNSA)
- Grant/Contract Number:
- NA0001835; DENA0001B35
- OSTI ID:
- 1223268
- Alternate ID(s):
- OSTI ID: 1222257
- Journal Information:
- Applied Optics, Vol. 54, Issue 19; ISSN 0003-6935
- Publisher:
- Optical Society of America (OSA)Copyright Statement
- Country of Publication:
- United States
- Language:
- English
Web of Science
Talbot–Lau x-ray deflectometry phase-retrieval methods for electron density diagnostics in high-energy density experiments
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journal | January 2018 |
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