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Title: Ptychography: Pushing the limits of X-ray microscopy

Ptychography is an advanced diffraction based imaging technique that can achieve resolution of 5 nm, and below. It is done by scanning a sample through a beam of focused x-rays using discrete yet overlapping scan steps. Scattering data is collected on a CCD camera, and the phase of the scattered light is reconstructed with sophisticated iterative algorithms. Because the experimental setup is similar, ptychography setups can be created by retrofitting existing STXM beam lines with new hardware. The other challenge comes in the reconstruction of the collected scattering images. Scattering data must be adjusted and packaged with experimental parameters to calibrate the reconstruction software. The necessary pre-processing of data prior to reconstruction is unique to each beamline setup, and even the optical alignments used on that particular day. Pre-processing software must be developed to be flexible and efficient in order to allow experimenters appropriate control and freedom in the analysis of their hard-won data. This paper will describe the implementation of pre-processing software which successfully connects data collection steps to reconstruction steps, letting the user accomplish accurate and reliable ptychography.
  1. SLAC National Accelerator Lab., Menlo Park, CA (United States)
Publication Date:
OSTI Identifier:
Report Number(s):
DOE Contract Number:
Resource Type:
Technical Report
Research Org:
SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States)
Sponsoring Org:
USDOE Office of Science (SC)
Country of Publication:
United States