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Title: Bayesian Models for Life Prediction and Fault-Mode Classification in Solid State Lamps

A new method has been developed for assessment of the onset of degradation in solid state luminaires to classifY failure mechanisms by using metrics beyond lumen degradation that are currently used for identification of failure. Luminous Flux output, Correlated Color Temperature Data on Philips LED Lamps has been gathered under 85°C/85%RH till lamp failure. The acquired data has been used in conjunction with Bayesian Probabilistic Models to identifY luminaires with onset of degradation much prior to failure through identification of decision boundaries between lamps with accrued damage and lamps beyond the failure threshold in the feature space. In addition luminaires with different failure modes have been classified separately from healthy pristine luminaires. It is expected that, the new test technique will allow the development of failure distributions without testing till L 70 life for the manifestation of failure.
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Publication Date:
OSTI Identifier:
Report Number(s):
EuroSime 4-2015
DOE Contract Number:
Resource Type:
Resource Relation:
Conference: 2015 16h International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)
Research Org:
RTI International
Sponsoring Org:
USDOE Office of Energy Efficiency and Renewable Energy (EERE), Building Technologies Office (EE-5B)
Contributing Orgs:
RTI International
Country of Publication:
United States