Serial snapshot crystallography for materials science with SwissFEL

Dejoie, Catherine; Smeets, Stef; Baerlocher, Christian; Tamura, Nobumichi; Pattison, Philip; Abela, Rafael; McCusker, Lynne B.

doi:10.1107/S2052252515006740

Title: Serial snapshot crystallography for materials science with SwissFEL

Journal Article · Tue Apr 21 00:00:00 EDT 2015 · IUCrJ

DOI:https://doi.org/10.1107/S2052252515006740· OSTI ID:1209942

Dejoie, Catherine ^[1]; Smeets, Stef ^[1]; Baerlocher, Christian ^[1]; Tamura, Nobumichi ^[2]; Pattison, Philip ^[3]; Abela, Rafael ^[4]; McCusker, Lynne B. ^[1]

Laboratory of Crystallography, ETH Zurich (Switzerland)
Lawrence Berkeley National Lab., CA (United States)
European Synchrotron Radiation Facility, Grenoble (France)
SwissFEL, Paul Scherrer Institut, Villigen PSI (Switzerland)

New opportunities for studying (sub)microcrystalline materials with small unit cells, both organic and inorganic, will open up when the X-ray free electron laser (XFEL) presently being constructed in Switzerland (SwissFEL) comes online in 2017. Our synchrotron-based experiments mimicking the 4%-energy-bandpass mode of the SwissFEL beam show that it will be possible to record a diffraction pattern of up to 10 randomly oriented crystals in a single snapshot, to index the resulting reflections, and to extract their intensities reliably. The crystals are destroyed with each XFEL pulse, but by combining snapshots from several sets of crystals, a complete set of data can be assembled, and crystal structures of materials that are difficult to analyze otherwise will become accessible. Even with a single shot, at least a partial analysis of the crystal structure will be possible, and with 10–50 femtosecond pulses, this offers tantalizing possibilities for time-resolved studies.

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Research Organization:: Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: AC02-05CH11231

OSTI ID:: 1209942

Journal Information:: IUCrJ, Vol. 2, Issue 3; ISSN 2052-2525

Publisher:: International Union of CrystallographyCopyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 18 works

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3D-structured supports create complete data sets for electron crystallography Wennmacher, Julian T. C.; Zaubitzer, Christian; Li, Teng Nature Communications, Vol. 10, Issue 1 https://doi.org/10.1038/s41467-019-11326-2	journal	July 2019
Generation of large-bandwidth x-ray free electron laser with evolutionary many-objective optimization algorithm Yan, Jiawei; Deng, Haixiao Physical Review Accelerators and Beams, Vol. 22, Issue 2 https://doi.org/10.1103/physrevaccelbeams.22.020703	journal	February 2019
Quantitative microstructural imaging by scanning Laue x-ray micro- and nanodiffraction Chen, Xian; Dejoie, Catherine; Jiang, Tengfei MRS Bulletin, Vol. 41, Issue 6 https://doi.org/10.1557/mrs.2016.97	journal	June 2016
3D-structured supports create complete data sets for electron crystallography T. C., Wennmacher, Julian; Christian, Zaubitzer,; Teng, Li, ETH Zurich https://doi.org/10.3929/ethz-b-000355679	text	January 2019

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