Band excitation method applicable to scanning probe microscopy

Jesse, Stephen; Kalinin, Sergei V.

Title: Band excitation method applicable to scanning probe microscopy

Patent · Tue Aug 04 00:00:00 EDT 2015

OSTI ID:1207241

Jesse, Stephen; Kalinin, Sergei V.

Scanning probe microscopy may include a method for generating a band excitation (BE) signal and simultaneously exciting a probe at a plurality of frequencies within a predetermined frequency band based on the excitation signal. A response of the probe is measured across a subset of frequencies of the predetermined frequency band and the excitation signal is adjusted based on the measured response.

View Patent

Cite

Export

Save

Research Organization:: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)

Sponsoring Organization:: USDOE

DOE Contract Number:: AC05-00OR22725

Assignee:: UT-Battelle, LLC (Oak Ridge, TN)

Patent Number(s):: 9,097,738

Application Number:: 13/886,748

OSTI ID:: 1207241

Resource Relation:: Patent File Date: 2013 May 03

Country of Publication:: United States

Language:: English

References (40)

Design and performance of a high-resolution frictional force microscope with quantitative three-dimensional force sensitivity Dienwiebel, M.; de Kuyper, E.; Crama, L. Review of Scientific Instruments, Vol. 76, Issue 4 https://doi.org/10.1063/1.1889233	journal	April 2005
Piezoelectricity of biopolymers Fukada, E. Biorheology, Vol. 32, Issue 6, p. 593-609 https://doi.org/10.1016/0006-355X(95)00039-C	journal	November 1995
Dynamic atomic force microscopy methods García, R. Surface Science Reports, Vol. 47, Issue 6-8 https://doi.org/10.1016/S0167-5729(02)00077-8	journal	September 2002
Magnetic dissipation force microscopy Grütter, P.; Liu, Y.; LeBlanc, P. Applied Physics Letters, Vol. 71, Issue 2 https://doi.org/10.1063/1.119519	journal	July 1997
Local poling of ferroelectric polymers by scanning force microscopy Güthner, P.; Dransfeld, K. Applied Physics Letters, Vol. 61, Issue 9 https://doi.org/10.1063/1.107693	journal	August 1992
Contact resonances in voltage-modulated force microscopy Harnagea, C.; Alexe, M.; Hesse, D. Applied Physics Letters, Vol. 83, Issue 2 https://doi.org/10.1063/1.1592307	journal	July 2003
Resonance enhancement in piezoresponse force microscopy: Mapping electromechanical activity, contact stiffness, and Q factor Jesse, Stephen; Mirman, Boris; Kalinin, Sergei V. Applied Physics Letters, Vol. 89, Issue 2 https://doi.org/10.1063/1.2221496	journal	July 2006
Dynamic behaviour in piezoresponse force microscopy Jesse, Stephen; Baddorf, Arthur P.; Kalinin, Sergei V. Nanotechnology, Vol. 17, Issue 6 https://doi.org/10.1088/0957-4484/17/6/014	journal	February 2006
Electromechanical imaging of biological systems with sub-10nm resolution Kalinin, Sergei V.; Rodriguez, B. J.; Jesse, S. Applied Physics Letters, Vol. 87, Issue 5 https://doi.org/10.1063/1.2006984	journal	August 2005
Domain pattern formation and kinetics on ferroelectric surfaces under thermal cycling using scanning force microscopy Likodimos, V.; Labardi, M.; Allegrini, M. Physical Review B, Vol. 66, Issue 2 https://doi.org/10.1103/PhysRevB.66.024104	journal	July 2002
Contact-Resonance Piezoresponse Force Microscope and Its Application to Domain Observation of Pb(Mg _1/3 Nb _2/3 )O ₃ –PbTiO ₃ Single Crystals Okino, Hirotake; Sakamoto, Junichi; Yamamoto, Takashi Japanese Journal of Applied Physics, Vol. 42, Issue Part 1, No. 9B https://doi.org/10.1143/JJAP.42.6209	journal	September 2003
A new atomic force microscope probe with force sensing integrated readout and active tip Onaran, A. G.; Balantekin, M.; Lee, W. Review of Scientific Instruments, Vol. 77, Issue 2 https://doi.org/10.1063/1.2166469	journal	February 2006
Atomic Force Acoustic Microscopy Rabe, Ute Applied Scanning Probe Methods II https://doi.org/10.1007/3-540-27453-7_2	book	January 2006
Piezoresponse force microscopy for polarity imaging of GaN Rodriguez, B. J.; Gruverman, A.; Kingon, A. I. Applied Physics Letters, Vol. 80, Issue 22 https://doi.org/10.1063/1.1483117	journal	June 2002
Local impedance imaging and spectroscopy of polycrystalline ZnO using contact atomic force microscopy Shao, Rui; Kalinin, Sergei V.; Bonnell, Dawn A. Applied Physics Letters, Vol. 82, Issue 12 https://doi.org/10.1063/1.1561168	journal	March 2003
Frequency response of cantilever beams immersed in viscous fluids with applications to the atomic force microscope Sader, John Elie Journal of Applied Physics, Vol. 84, Issue 1 https://doi.org/10.1063/1.368002	journal	July 1998
Tip-surface forces, amplitude, and energy dissipation in amplitude-modulation (tapping mode) force microscopy Paulo, Álvaro San; García, Ricardo Physical Review B, Vol. 64, Issue 19 https://doi.org/10.1103/PhysRevB.64.193411	journal	October 2001
Simultaneous elastic and electromechanical imaging by scanning probe microscopy: Theory and applications to ferroelectric and biological materials Shin, J.; Rodriguez, B. J.; Baddorf, A. P. Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, Vol. 23, Issue 5 https://doi.org/10.1116/1.2052714	journal	January 2005
Estimating the transfer function of the cantilever in atomic force microscopy: A system identification approach Stark, Martin; Guckenberger, Reinhard; Stemmer, Andreas Journal of Applied Physics, Vol. 98, Issue 11 https://doi.org/10.1063/1.2137887	journal	December 2005
Silicon dopant imaging by dissipation force microscopy Stowe, T. D.; Kenny, T. W.; Thomson, D. J. Applied Physics Letters, Vol. 75, Issue 18 https://doi.org/10.1063/1.125149	journal	November 1999
Relationship between phase shift and energy dissipation in tapping-mode scanning force microscopy Tamayo, Javier; Garcı́a, Ricardo Applied Physics Letters, Vol. 73, Issue 20 https://doi.org/10.1063/1.122632	journal	November 1998
Resonance frequency and Q factor mapping by ultrasonic atomic force microscopy Yamanaka, Kazushi; Maruyama, Yoshiki; Tsuji, Toshihiro Applied Physics Letters, Vol. 78, Issue 13 https://doi.org/10.1063/1.1357540	journal	March 2001
Drift compensation for scanning probe microscopes using an enhanced probe positioning system Elings, Virgil B.; Gurley, John A.; Rodgers, Mark https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/5077473 US Patent Document 5,077,473	patent	December 1991
Double cantilever sensor for atomic force microscope Abraham, David W.; O'Boyle, Martin P. https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/5267471 US Patent Document 5,267,471	patent	December 1993
Methods of operating atomic force microscopes to measure friction Elings, Virgil B. https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/5553487 US Patent Document 5,553,487	patent	September 1996
Resonance contact scanning force microscope Gamble, Ronald C. https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/5681987 US Patent Document 5,681,987	patent	October 1997
Cantilever deflection sensor and use thereof Bourgoin, Jean-Philippe; Johnson, Matthew B.; Michel, Bruno https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/5804709 US Patent Document 5,804,709	patent	September 1998
Scanning probe microscope with scan correction Park, Sang-Il; Smith, Ian R. https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/6057547 US Patent Document 6,057,547	patent	May 2000
Differential force microscope Ludeke, Rudolf; Wen, Huajun https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/6085580 US Patent Document 6,085,580	patent	July 2000
Sampling scanning probe microscope and sampling method thereof Yasutake, Masatoshi; Inoue, Akira; Sakai, Fumiki https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/6094972 US Patent Document 6,094,972	patent	August 2000
Scanning force microscope with high-frequency cantilever Zypman Niechonski, Fredy Ruben; Eppell, Steven J. https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/6145374 US Patent Document 6,145,374	patent	November 2000
Method and apparatus for measuring mechanical and electrical characteristics of a surface using electrostatic force modulation microscopy which operates in contact mode Hong, James; Park, Sang-Il; Khim, Zheong-Gu https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/6185991 US Patent Document 6,185,991	patent	February 2001
Method of producing magnetic force image and scanning probe microscope Kitamura, Shinichi https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/6281495 US Patent Document 6,281,495	patent	August 2001
Scanning probe microscope and method of measuring geometry of sample surface with scanning probe microscope Yasutake, Masatoshi; Inoue, Akira; Homma, Akihiko https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/6499340 US Patent Document 6,499,340	patent	December 2002
Probe device Matsumoto, Takuya; Naitoh, Yasuhisa; Kawai, Tomoji https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7250602 US Patent Document 7,250,602	patent	July 2007
Scanning probe microscope Watanabe, Kazutoshi https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7404313 US Patent Document 7,404,313	patent	July 2008
Band excitation method applicable to scanning probe microscopy Jesse, Stephen; Kalinin, Sergei V. https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7775086 US Patent Document 7,775,086	patent	August 2010
Band excitation method applicable to scanning probe microscopy Jesse, Stephen; Kalinin, Sergei V. https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/8448502 US Patent Document 8,448,502	patent	May 2013
Chemical Sensor with Oscillating Cantilevered Probe and Mechanical Stop Adams, Jesse D.; Rogers, Benjamin S. https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20050009197 US Patent Application 10/777282; 20050009197	patent-application	January 2005
Scanning probe microscopy apparatus and techniques Shao, Rui; Kalinin, Sergei V.; Bonnell, Dawn A. https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20050262930 US Patent Application 11/084543; 20050262930	patent-application	December 2005

Similar Records

Band excitation method applicable to scanning probe microscopy

Patent · Tue Jan 03 00:00:00 EST 2017 · OSTI ID:1207241

Jesse, Stephen; Kalinin, Sergei V.

Band excitation method applicable to scanning probe microscopy

Patent · Tue Aug 17 00:00:00 EDT 2010 · OSTI ID:1207241

Jesse, Stephen; Kalinin, Sergei V

Band excitation method applicable to scanning probe microscopy

Patent · Tue May 28 00:00:00 EDT 2013 · OSTI ID:1207241

Jesse, Stephen; Kalinin, Sergei V

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY

Title: Band excitation method applicable to scanning probe microscopy

Citation Formats

References (40)

Similar Records

Related Subjects