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Title: Kelvin Probe Force Microscopy in liquid using Electrochemical Force Microscopy

Journal Article · · Beilstein Journal of Nanotechnology
DOI:https://doi.org/10.3762/bjnano.6.19· OSTI ID:1185854
 [1];  [2];  [3];  [2];  [2];  [4];  [1]
  1. Univ. College, Dublin (Ireland). School of Physics and Conway Inst. of Biomolecular and Biomedical Research
  2. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences
  3. Univ. College, Dublin (Ireland). Conway Inst. of Biomolecular and Biomedical Research
  4. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences and Inst. for Functioning Imaging of Materials

Conventional closed loop-Kelvin probe force microscopy (KPFM) has emerged as a powerful technique for probing electric and transport phenomena at the solid-gas interface. The extension of KPFM capabilities to probe electrostatic and electrochemical phenomena at the solid–liquid interface is of interest for a broad range of applications from energy storage to biological systems. However, the operation of KPFM implicitly relies on the presence of a linear lossless dielectric in the probe-sample gap, a condition which is violated for ionically-active liquids (e.g., when diffuse charge dynamics are present). Here, electrostatic and electrochemical measurements are demonstrated in ionically-active (polar isopropanol, milli-Q water and aqueous NaCl) and ionically-inactive (non-polar decane) liquids by electrochemical force microscopy (EcFM), a multidimensional (i.e., bias- and time-resolved) spectroscopy method. In the absence of mobile charges (ambient and non-polar liquids), KPFM and EcFM are both feasible, yielding comparable contact potential difference (CPD) values. In ionically-active liquids, KPFM is not possible and EcFM can be used to measure the dynamic CPD and a rich spectrum of information pertaining to charge screening, ion diffusion, and electrochemical processes (e.g., Faradaic reactions). EcFM measurements conducted in isopropanol and milli-Q water over Au and highly ordered pyrolytic graphite electrodes demonstrate both sample- and solvent-dependent features. Finally, the feasibility of using EcFM as a local force-based mapping technique of material-dependent electrostatic and electrochemical response is investigated. The resultant high dimensional dataset is visualized using a purely statistical approach that does not require a priori physical models, allowing for qualitative mapping of electrostatic and electrochemical material properties at the solid–liquid interface.

Research Organization:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)
Sponsoring Organization:
USDOE Office of Science (SC)
Grant/Contract Number:
AC05-00OR22725
OSTI ID:
1185854
Journal Information:
Beilstein Journal of Nanotechnology, Vol. 6; ISSN 2190-4286
Publisher:
Beilstein InstituteCopyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 33 works
Citation information provided by
Web of Science

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Cited By (8)

Full data acquisition in Kelvin Probe Force Microscopy: Mapping dynamic electric phenomena in real space journal August 2016
Advanced space- and time-resolved techniques for photocatalyst studies journal January 2020
Ferroelectric or non-ferroelectric: Why so many materials exhibit “ferroelectricity” on the nanoscale journal June 2017
Multifrequency spectrum analysis using fully digital G Mode-Kelvin probe force microscopy journal February 2016
Towards nanoscale electrical measurements in liquid by advanced KPFM techniques: a review journal July 2018
Frequency-dependent force between ac-voltage-biased plates in electrolyte solutions journal August 2019
Ferroelectric or non-ferroelectric: why so many materials exhibit ferroelectricity on the nanoscale preprint January 2017
Advanced atomic force microscopy techniques III text January 2016

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