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Title: Atomic-Resolution Investigation of Irradiation-Induced Defects in Silicon Carbide

Conference ·
OSTI ID:1185417

Research Organization:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)
Sponsoring Organization:
Work for Others (WFO)
DOE Contract Number:
AC05-00OR22725
OSTI ID:
1185417
Resource Relation:
Conference: Microscopy and Microanalysis, Hartford, CT, USA, 20140803, 20140803
Country of Publication:
United States
Language:
English

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