Device Isolation in Hybrid Field-Effect Transistors by Semiconductor Micropatterning Using Picosecond Lasers
Journal Article
·
· Physical Review Applied
- Sponsoring Organization:
- USDOE
- Grant/Contract Number:
- FG02-07ER46465
- OSTI ID:
- 1180119
- Journal Information:
- Physical Review Applied, Vol. 2, Issue 4; ISSN 2331-7019
- Publisher:
- American Physical SocietyCopyright Statement
- Country of Publication:
- United States
- Language:
- English
Cited by: 2 works
Citation information provided by
Web of Science
Web of Science
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