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Title: Impact of ASTM Standard E722 update on radiation damage metrics.

The impact of recent changes to the ASTM Standard E722 is investigated. The methodological changes in the production of the displacement kerma factors for silicon has significant impact for some energy regions of the 1-MeV(Si) equivalent fluence response function. When evaluating the integral over all neutrons energies in various spectra important to the SNL electronics testing community, the change in the response results in an increase in the total 1-MeV(Si) equivalent fluence of 2 7%. Response functions have been produced and are available for users of both the NuGET and MCNP codes.
Publication Date:
OSTI Identifier:
Report Number(s):
DOE Contract Number:
Resource Type:
Technical Report
Research Org:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org:
USDOE National Nuclear Security Administration (NNSA)
Country of Publication:
United States