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Title: Dual-Sensor Technique for Characterization of Carrier Lifetime Decay Transients in Semiconductors

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.4903213· OSTI ID:1166656

Research Organization:
National Renewable Energy Lab. (NREL), Golden, CO (United States)
Sponsoring Organization:
USDOE Office of Energy Efficiency and Renewable Energy (EERE), Renewable Power Office. Solar Energy Technologies Office
DOE Contract Number:
AC36-08GO28308
OSTI ID:
1166656
Journal Information:
Journal of Applied Physics, Vol. 116, Issue 21; Related Information: Article No. 214510; ISSN 0021-8979
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English