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Title: Reciprocal space XRD mapping with varied incident angle as a probe of structure variation within surface depth

In this study, we used a differential-depth X-Ray diffraction Reciprocal Spacing Mapping (XRD RSM) technique to investigate the crystal quality of a variety of SRF-relevant Nb film and bulk materials. By choosing different X-ray probing depths, the RSM study successfully revealed evolution the of materials microstructure after different materials processes, such as energetic condensation or surface polishing. The RSM data clearly measured the materials crystal quality at different thickness. Through a novel differential-depth RSM technique, this study found: I. for a heteroepitaxy Nb film Nb(100)/MgO(100), the film thickening process, via a cathodic arc-discharge Nb ion deposition, created a near-perfect single crystal Nb on the surfaces top-layer; II. for a mechanically polished single-crystal bulk Nb material, the microstructure on the top surface layer is more disordered than that in-grain.
 [1] ;  [1] ;  [2] ;  [2] ;  [3]
  1. Norfolk State University
  2. JLAB
  3. AASC, San Leandro, California
Publication Date:
OSTI Identifier:
Report Number(s):
JLAB-ACC-13-1700; DOE/OR/23177-2821
FG02-08ER85162; SC0004994
DOE Contract Number:
Resource Type:
Resource Relation:
Conference: SRF 2013, 23-27 Sept 2013. Paris, France
Research Org:
Thomas Jefferson National Accelerator Facility, Newport News, VA (United States)
Sponsoring Org:
USDOE Office of Science (SC)
Country of Publication:
United States