Kapitza resistance of Si/SiO2 interface

Deng, Bowen; Chernatynskiy, Aleksandr; Khafizov, Marat; Hurley, David H.; Phillpot, Simon R.

doi:10.1063/1.4867047

Title: Kapitza resistance of Si/SiO2 interface

Journal Article · Fri Feb 28 00:00:00 EST 2014 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.4867047· OSTI ID:1161591

Deng, Bowen; Chernatynskiy, Aleksandr; Khafizov, Marat; Hurley, David H.; Phillpot, Simon R.

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Research Organization:: Energy Frontier Research Centers (EFRC) (United States). Center for Materials Science of Nuclear Fuel (CMSNF)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

DOE Contract Number:: AC07-05ID14517

OSTI ID:: 1161591

Journal Information:: Journal of Applied Physics, Vol. 115; Related Information: CMSNF partners with Idaho National Laboratory (lead); Colorado School of Mines; University of Florida; Oak Ridge National Laboratory; Purdue University; University of Wisconsin at Madison

Country of Publication:: United States

Language:: English

References (27)

Frontiers of silicon-on-insulator Celler, G. K.; Cristoloveanu, Sorin Journal of Applied Physics, Vol. 93, Issue 9 https://doi.org/10.1063/1.1558223	journal	May 2003
Measurement of the Kapitza resistance across a bicrystal interface Hurley, D. H.; Khafizov, M.; Shinde, S. L. Journal of Applied Physics, Vol. 109, Issue 8 https://doi.org/10.1063/1.3573511	journal	April 2011
Estimating Kapitza resistance between Si-SiO2 interface using molecular dynamics simulations Mahajan, Sanket S.; Subbarayan, Ganesh; Sammakia, Bahgat G. 2008 11th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (I-THERM), 2008 11th Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems https://doi.org/10.1109/ITHERM.2008.4544379	conference	May 2008
Thermal boundary resistance at silicon-silica interfaces by molecular dynamics simulations Lampin, E.; Nguyen, Q. -H.; Francioso, P. A. Applied Physics Letters, Vol. 100, Issue 13 https://doi.org/10.1063/1.3698325	journal	March 2012
Interatomic potential for Si–O systems using Tersoff parameterization Munetoh, Shinji; Motooka, Teruaki; Moriguchi, Koji Computational Materials Science, Vol. 39, Issue 2 https://doi.org/10.1016/j.commatsci.2006.06.010	journal	April 2007
Thermal contact resistance across nanoscale silicon dioxide and silicon interface Chen, Jie; Zhang, Gang; Li, Baowen Journal of Applied Physics, Vol. 112, Issue 6 https://doi.org/10.1063/1.4754513	journal	September 2012
Phonon-defect scattering in doped silicon by molecular dynamics simulation Yao, M.; Watanabe, T.; Schelling, P. K. Journal of Applied Physics, Vol. 104, Issue 2 https://doi.org/10.1063/1.2959840	journal	July 2008
Phonon wave-packet dynamics at semiconductor interfaces by molecular-dynamics simulation Schelling, P. K.; Phillpot, S. R.; Keblinski, P. Applied Physics Letters, Vol. 80, Issue 14 https://doi.org/10.1063/1.1465106	journal	April 2002
Kapitza conductance and phonon scattering at grain boundaries by simulation Schelling, P. K.; Phillpot, S. R.; Keblinski, P. Journal of Applied Physics, Vol. 95, Issue 11 https://doi.org/10.1063/1.1702100	journal	June 2004
Novel Interatomic Potential Energy Function for Si, O Mixed Systems Watanabe, Takanobu; Fujiwara, Hiroki; Noguchi, Hidekazu Japanese Journal of Applied Physics, Vol. 38, Issue Part 2, No. 4A https://doi.org/10.1143/JJAP.38.L366	journal	April 1999
Modeling of SiO2/Si(100) interface structure by using extended -Stillinger-Weber potential Watanabe, Takanobu; Ohdomari, Iwao Thin Solid Films, Vol. 343-344 https://doi.org/10.1016/S0040-6090(98)01700-3	journal	April 1999
SiO2/Si interface structure and its formation studied by large-scale molecular dynamics simulation Watanabe, T.; Tatsumura, K.; Ohdomari, I. Applied Surface Science, Vol. 237, Issue 1-4 https://doi.org/10.1016/j.apsusc.2004.06.044	journal	October 2004
Computer simulation of local order in condensed phases of silicon Stillinger, Frank H.; Weber, Thomas A. Physical Review B, Vol. 31, Issue 8 https://doi.org/10.1103/PhysRevB.31.5262	journal	April 1985
Lattice thermal conductivity of silicon from empirical interatomic potentials Broido, D. A.; Ward, A.; Mingo, N. Physical Review B, Vol. 72, Issue 1 https://doi.org/10.1103/PhysRevB.72.014308	journal	July 2005
GULP: A computer program for the symmetry-adapted simulation of solids Gale, Julian D. Journal of the Chemical Society, Faraday Transactions, Vol. 93, Issue 4 https://doi.org/10.1039/a606455h	journal	January 1997
Scattering of phonons from a high-energy grain boundary in silicon: Dependence on angle of incidence Kimmer, Chris; Aubry, Sylvie; Skye, Ashton Physical Review B, Vol. 75, Issue 14 https://doi.org/10.1103/PhysRevB.75.144105	journal	April 2007
Effect of lattice mismatch on phonon transmission and interface thermal conductance across dissimilar material interfaces Li, Xiaobo; Yang, Ronggui Physical Review B, Vol. 86, Issue 5 https://doi.org/10.1103/PhysRevB.86.054305	journal	August 2012
Phonon engineering in nanostructures for solid-state energy conversion Chen, G.; Zeng, T.; Borca-Tasciuc, T. Materials Science and Engineering: A, Vol. 292, Issue 2 https://doi.org/10.1016/S0921-5093(00)00999-0	journal	November 2000
Single-mode phonon transmission in symmetry-broken carbon nanotubes: Role of phonon symmetries Wang, Jian; Wang, Jian-Sheng Journal of Applied Physics, Vol. 105, Issue 6 https://doi.org/10.1063/1.3082108	journal	March 2009
Effect of anharmonicity on Kapitza resistance Ge, Yuzhen; Chen, Shigang Solid State Communications, Vol. 77, Issue 4 https://doi.org/10.1016/0038-1098(91)90841-I	journal	January 1991
Kapitza conductance of silicon–amorphous polyethylene interfaces by molecular dynamics simulations Hu, Ming; Keblinski, Pawel; Schelling, Patrick K. Physical Review B, Vol. 79, Issue 10 https://doi.org/10.1103/Physrevb.79.104305	journal	March 2009
Monte Carlo Study of Phonon Transport in Solid Thin Films Including Dispersion and Polarization Mazumder, Sandip; Majumdar, Arunava Journal of Heat Transfer, Vol. 123, Issue 4 https://doi.org/10.1115/1.1377018	journal	January 2001
Nanostructure thermal conductivity prediction by Monte Carlo sampling of phonon free paths McGaughey, Alan J. H.; Jain, Ankit Applied Physics Letters, Vol. 100, Issue 6 https://doi.org/10.1063/1.3683539	journal	February 2012
Thermal transport in fractal systems Kjems, Jørgen K. Physica A: Statistical Mechanics and its Applications, Vol. 191, Issue 1-4 https://doi.org/10.1016/0378-4371(92)90547-4	journal	December 1992
Ordering and structural changes at the glass–liquid transition Ojovan, Michael I. Journal of Non-Crystalline Solids, Vol. 382 https://doi.org/10.1016/j.jnoncrysol.2013.10.016	journal	December 2013
Nanostructure thermal conductivity prediction by Monte Carlo sampling of phonon free paths McGaughey, Alan J. H.; Jain, Ankit Carnegie Mellon University https://doi.org/10.1184/r1/6490040.v1	text	January 2012
Nanostructure thermal conductivity prediction by Monte Carlo sampling of phonon free paths McGaughey, Alan J. H.; Jain, Ankit Carnegie Mellon University https://doi.org/10.1184/r1/6490040	text	January 2012

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Heat flow across an oxide layer in Si Stanley, Christopher M.; Estreicher, Stefan K. physica status solidi (a), Vol. 214, Issue 7 https://doi.org/10.1002/pssa.201700204	journal	May 2017
Phonon Dynamics at an Oxide Layer in Silicon: Heat Flow and Kapitza Resistance Stanley, Christopher M.; Estreicher, Stefan K. physica status solidi (a), Vol. 216, Issue 10 https://doi.org/10.1002/pssa.201800428	journal	September 2018
Predicting interfacial thermal resistance by machine learning Wu, Yen-Ju; Fang, Lei; Xu, Yibin npj Computational Materials, Vol. 5, Issue 1 https://doi.org/10.1038/s41524-019-0193-0	journal	May 2019
Atomic-scale thermal manipulation with adsorbed atoms on a solid surface at a liquid-solid interface Fujiwara, Kunio; Shibahara, Masahiko Scientific Reports, Vol. 9, Issue 1 https://doi.org/10.1038/s41598-019-49677-x	journal	September 2019
Study of thermal conductivity of ice clusters after impact deposition on the silica surfaces using the ReaxFF reactive force field Rahnamoun, A.; van Duin, A. C. T. Physical Chemistry Chemical Physics, Vol. 18, Issue 3 https://doi.org/10.1039/c5cp05741h	journal	January 2016
Two-dimensional materials and their prospects in transistor electronics Schwierz, F.; Pezoldt, J.; Granzner, R. Nanoscale, Vol. 7, Issue 18 https://doi.org/10.1039/c5nr01052g	journal	January 2015
Research Update: Phonon engineering of nanocrystalline silicon thermoelectrics Shiomi, Junichiro APL Materials, Vol. 4, Issue 10 https://doi.org/10.1063/1.4962935	journal	September 2016
Phonon transport at interfaces between different phases of silicon and germanium Gordiz, Kiarash; Henry, Asegun Journal of Applied Physics, Vol. 121, Issue 2 https://doi.org/10.1063/1.4973573	journal	January 2017
Tutorial: Determination of thermal boundary resistance by molecular dynamics simulations Liang, Zhi; Hu, Ming Journal of Applied Physics, Vol. 123, Issue 19 https://doi.org/10.1063/1.5027519	journal	May 2018
Detection of heat flux at single-atom scale in a liquid-solid interfacial region based on classical molecular dynamics Fujiwara, K.; Shibahara, M. Applied Physics Letters, Vol. 114, Issue 1 https://doi.org/10.1063/1.5062589	journal	January 2019
Interface conductance modal analysis of a crystalline Si-amorphous SiO ₂ interface Gordiz, Kiarash; Muraleedharan, Murali Gopal; Henry, Asegun Journal of Applied Physics, Vol. 125, Issue 13 https://doi.org/10.1063/1.5085328	journal	April 2019
A phonon wave packet study of thermal energy transport across functionalized hard-soft interfaces Wei, Xingfei; Luo, Tengfei Journal of Applied Physics, Vol. 126, Issue 1 https://doi.org/10.1063/1.5095775	journal	July 2019
Thermal conductivity of thin film-substrate systems from two-side scanning photothermal deflection measurements: Theoretical model and validation Kazemian, Sina; Bazylewski, Paul; Bauld, Reg The Journal of Chemical Physics, Vol. 150, Issue 18 https://doi.org/10.1063/1.5096408	journal	May 2019
Correlation of shear forces and heat conductance in nanoscale junctions Robinson, Benjamin J.; Pumarol, Manuel E.; Kolosov, Oleg V. Physical Review B, Vol. 100, Issue 23 https://doi.org/10.1103/physrevb.100.235426	journal	December 2019
Thermal Boundary Characteristics of Homo-/Heterogeneous Interfaces Heijmans, Koen; Pathak, Amar Deep; Solano-López, Pablo Nanomaterials, Vol. 9, Issue 5 https://doi.org/10.3390/nano9050663	journal	April 2019
Light Induced Electron-Phonon Scattering Mediated Resistive Switching in Nanostructured Nb Thin Film Superconductor Kazim, Shafaq; Sharma, Alka; Yadav, Sachin arXiv https://doi.org/10.48550/arxiv.1704.04092	text	January 2017

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