X-ray backscatter imaging of nuclear materials

Chapman, Jeffrey Allen; Gunning, John E; Hollenbach, Daniel F; Ott, Larry J; Shedlock, Daniel

Title: X-ray backscatter imaging of nuclear materials

Patent · Tue Sep 30 00:00:00 EDT 2014

OSTI ID:1159920

Chapman, Jeffrey Allen; Gunning, John E; Hollenbach, Daniel F; Ott, Larry J; Shedlock, Daniel

The energy of an X-ray beam and critical depth are selected to detect structural discontinuities in a material having an atomic number Z of 57 or greater. The critical depth is selected by adjusting the geometry of a collimator that blocks backscattered radiation so that backscattered X-ray originating from a depth less than the critical depth is not detected. Structures of Lanthanides and Actinides, including nuclear fuel rod materials, can be inspected for structural discontinuities such as gaps, cracks, and chipping employing the backscattered X-ray.

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Research Organization:: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)

Sponsoring Organization:: USDOE

DOE Contract Number:: ACO5-000R22725

Assignee:: UT-Battelle, LLC (Oak Ridge, TN)

Patent Number(s):: 8,848,871

Application Number:: 13/288,168

OSTI ID:: 1159920

Country of Publication:: United States

Language:: English

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