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Title: Microstructure and thermal oxidation behavior of yttria-stabilized hafnia nanostructured coatings deposited on alumina

Nanostructured yttria-stabilized hafnia (YSH) coatings were grown on α-Al2O3 substrates with variable coating thickness in a wide range of ~50 nm to 1 μm. Microstructure and thermal oxidation behavior of the grown YSH coatings were studied employing X-ray diffraction (XRD), Rutherford backscattering spectrometry (RBS), scanning electron microscopy (SEM) and isothermal furnace oxidation testing. The effect of coating thickness on the crystal structure, surface/interface morphology and thermal oxidation was investigated. X-ray diffraction analyses revealed the formation of monoclinic phase for relatively thin coatings (b100 nm) indicating that the interfacial phenomena play a dominant role in phase stabilization. The evolution towards stabilized cubic phase with increasing coating thickness is observed. The SEM results indicate the dense, columnar structure of YSH coatings as a function of thickness. Thermal oxidation measurements indicate the enhanced hightemperature oxidation resistance of cubic YSH coatings.
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  1. Univ. of Texas, El Paso, TX (United States)
  2. Pacific Northwest National Lab. (PNNL), Richland, WA (United States)
Publication Date:
OSTI Identifier:
Report Number(s):
Journal ID: ISSN 0257-8972; 46698; KP1704020
DOE Contract Number:
Resource Type:
Journal Article
Resource Relation:
Journal Name: Surface and Coatings Technology; Journal Volume: 236; Journal Issue: C
Research Org:
Pacific Northwest National Laboratory (PNNL), Richland, WA (United States), Environmental Molecular Sciences Laboratory (EMSL)
Sponsoring Org:
Country of Publication:
United States
36 MATERIALS SCIENCE Environmental Molecular Sciences Laboratory