X-ray characterization of solid small molecule organic materials

Billinge, Simon; Shankland, Kenneth; Shankland, Norman; Florence, Alastair

Title: X-ray characterization of solid small molecule organic materials

Patent · Tue Jun 10 00:00:00 EDT 2014

OSTI ID:1133820

Billinge, Simon; Shankland, Kenneth; Shankland, Norman; Florence, Alastair

The present invention provides, inter alia, methods of characterizing a small molecule organic material, e.g., a drug or a drug product. This method includes subjecting the solid small molecule organic material to x-ray total scattering analysis at a short wavelength, collecting data generated thereby, and mathematically transforming the data to provide a refined set of data.

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Research Organization:: Brookhaven National Laboratory (BNL), Upton, NY (United States)

Sponsoring Organization:: USDOE

DOE Contract Number:: AC02-98CH10886

Assignee:: The Trustees of Columbia University in the City of New York (New York, NY)

Patent Number(s):: 8,751,168

Application Number:: 12/802,064

OSTI ID:: 1133820

Country of Publication:: United States

Language:: English

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