An X-Ray Fluorescence Study on the Segregation of Cs and I in and Inverted Organic Solar Cell

Journal Article · Tue Oct 08 00:00:00 EDT 2013 · Organic Electronics

DOI:https://doi.org/10.1016/j.orgel.2013.09.019· OSTI ID:1133349

Lindemann, William R. ^[1]; Xiao, Teng ^[1]; Wang, Wenjie ^[1]; Berry, Jonna E. ^[1]; Anderson, Nathaniel A. ^[1]; Houk, Robert S. ^[1]; Shinar, Ruth ^[1]; Shinar, Joseph ^[1]; Vaknin, David ^[1]

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1. Ames Laboratory

X-ray near-total-reflection fluorescence reveals that in multilayers of the inverted organic solar cell (ITO/CsI/P3HT:PCBM-based) Cs diffuses into the organic layer and iodide diffuses into the ITO. Laser ablation inductively coupled plasma mass spectrometry measurements, which integrate elemental concentration across the whole multilayer structure, indicate that the Cs:I ratio remains 1:1 confirming there is no loss of iodine from the sample. Iodide diffusion to the bulk ITO layer is also found in a similarly prepared ITO/NaI/P3HT:PCBM multilayer structure. Our results are consistent with recent XPS measurements which show that the Cs:I ratio at the ITO/CsI surface exceeds 8:1, and rationalize this observation.

• Research Organization: Ames Lab., Ames, IA (United States)
• Sponsoring Organization: USDOE Office of Science (SC)
• DOE Contract Number: DE-AC02-07CH11358
• OSTI ID: 1133349
• Report Number(s): IS-J 8204
• Journal Information: Organic Electronics, Vol. 14, Issue 2013; ISSN 1566-1199
• Publisher: Elsevier
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
Inverted organic solar cells
CsI Interlayer
X-ray fluorescence
Inductively coupled plasma mass spectrometry
Laser ablation