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Title: An X-Ray Fluorescence Study on the Segregation of Cs and I in and Inverted Organic Solar Cell

X-ray near-total-reflection fluorescence reveals that in multilayers of the inverted organic solar cell (ITO/CsI/P3HT:PCBM-based) Cs diffuses into the organic layer and iodide diffuses into the ITO. Laser ablation inductively coupled plasma mass spectrometry measurements, which integrate elemental concentration across the whole multilayer structure, indicate that the Cs:I ratio remains 1:1 confirming there is no loss of iodine from the sample. Iodide diffusion to the bulk ITO layer is also found in a similarly prepared ITO/NaI/P3HT:PCBM multilayer structure. Our results are consistent with recent XPS measurements which show that the Cs:I ratio at the ITO/CsI surface exceeds 8:1, and rationalize this observation.
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  1. Ames Laboratory
Publication Date:
OSTI Identifier:
Report Number(s):
IS-J 8204
Journal ID: ISSN 1566-1199
DOE Contract Number:
Resource Type:
Journal Article
Resource Relation:
Journal Name: Organic Electronics; Journal Volume: 14; Journal Issue: 2013
Research Org:
Ames Laboratory (AMES), Ames, IA (United States)
Sponsoring Org:
USDOE Office of Science (SC)
Country of Publication:
United States
36 MATERIALS SCIENCE Inverted organic solar cells; CsI Interlayer; X-ray fluorescence; Inductively coupled plasma mass spectrometry; Laser ablation