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Title: Thermal Runaway Risk Evaluation of Li-Ion Cells Using a Pinch-Torsion Test

Internal short circuit (ISCr) can lead to failure of Li-ion cells and sometimes result in thermal runaway. Understanding the behavior of Li-ion cells in ISCr condition is thus critical to evaluate the safety of these energy storage devices. In the current work, a pinch-torsion test is developed to simulate ISCr in a controlled manner. It is demonstrated that the torsional component superimposed on compression loading can reduce the axial load required to induce ISCr with smaller short spot size. Using this pinch-torsion test, two commercial Li-ion pouch cells were tested under different state of charge (SOC). Based on the severity of the cell damage, a series of thermal runaway risk scores were used to rate the thermal stability of these cells. One of the cell types showed significantly increased hazard as the SOC increased while the other type exhibited relative uniform behavior among different SOC. Therefore this novel pinch-torsion test seems to be an attractive candidate for safety testing of Li-ion cells due to its abilities to consistently create small ISCr spots and to differentiate cell stability in a wide range of SOC.
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  1. ORNL
Publication Date:
OSTI Identifier:
DOE Contract Number:
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Power Sources; Journal Volume: 249
Research Org:
Oak Ridge National Laboratory (ORNL); High Temperature Materials Laboratory
Sponsoring Org:
EE USDOE - Office of Energy Efficiency and Renewable Energy (EE)
Country of Publication:
United States
Li-ion cell; internal short circuit; pinch-torsion