Method and apparatus for measuring properties of a compound

Meng, Ling Jian

Title: Method and apparatus for measuring properties of a compound

Patent · Tue Oct 22 00:00:00 EDT 2013

OSTI ID:1107596

Meng, Ling Jian

A system that incorporates teachings of the present disclosure may include, for example, an apparatus having a collimator having at least one aperture and a fluorescence detector. The collimator can be positioned next to a compound. The compound can emit fluorescence X-rays when impacted by an X-ray beam generated by an X-ray source. The collimator can absorb at least a first portion of the fluorescence X-rays emitted by the compound and release at least a second portion of the fluorescence X-rays at the at least one aperture. The second portion of the fluorescence X-rays released by the at least one aperture have known directional information based on a position of the collimator. The fluorescence detector can detect the second portion of the fluorescence X-rays released by the at least one aperture. A three-dimensional (3-D) rendering of an elemental distribution of the compound can be determined from the fluorescence X-rays detected and the directional information. Additional embodiments are disclosed.

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Research Organization:: Argonne National Laboratory (ANL), Argonne, IL (United States)

Sponsoring Organization:: USDOE

DOE Contract Number:: AC02-06CH11357

Assignee:: The Board of Trustees of the University of Illinois (Urbana, IL)

Patent Number(s):: 8,565,376

Application Number:: 12/986,160

OSTI ID:: 1107596

Country of Publication:: United States

Language:: English

References (23)

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