skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Update on Elevated Temperature Reliability Testing of 1200 V SiC MOSFETs.

Conference ·
OSTI ID:1107188

Abstract not provided.

Research Organization:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
DOE Contract Number:
AC04-94AL85000
OSTI ID:
1107188
Report Number(s):
SAND2013-6974C; 465842
Resource Relation:
Conference: Proposed for presentation at the ARL SiC MOS Program Review held August 22-23, 2013 in College Park, MD.
Country of Publication:
United States
Language:
English