SAAF: SANS data Analysis using Analytical Functions

Zhao, Jinkui

doi:10.1107/S0021889811046188

Title: SAAF: SANS data Analysis using Analytical Functions

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Abstract

The recently completed Extended Q-Range Small Angle Scattering Diffractometer (EQ-SANS) has put the focus on its software needs with renewed urgency. In a series of efforts, we aim at providing a complete set of software solutions on the EQ-SANS instrument. These programs include initial data processing, data correction and reduction, analytical model fitting to the scattering data, Monte Carlo simulation for structure determination, and virtual instrument simulation for experiment planning. SAAF is one such program for analytical data modeling. It takes the reduced EQ-SANS data and allows users to fit the data to analytical models. These models are easy to write. They can either be user written, or from the pre-supplied model library.

Authors:

Zhao, Jinkui ^[1]

ORNL

Publication Date:: Sat Jan 01 00:00:00 EST 2011

Research Org.:: Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Spallation Neutron Source (SNS)

Sponsoring Org.:: USDOE Office of Science (SC)

OSTI Identifier:: 1092162

DOE Contract Number:: DE-AC05-00OR22725

Resource Type:: Journal Article

Journal Name:: Journal of Applied Crystallography

Additional Journal Information:: Journal Volume: 44; Journal Issue: 6; Journal ID: ISSN 0021--8898

Country of Publication:: United States

Language:: English

Subject:: SANS; EQ-SANS; SNS; Data reduction; Data Analysis

Citation Formats


                    Zhao, Jinkui. SAAF: SANS data Analysis using Analytical Functions.  United States: N. p., 2011. 
        Web.  doi:10.1107/S0021889811046188.

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                    Zhao, Jinkui. SAAF: SANS data Analysis using Analytical Functions.  United States.  https://doi.org/10.1107/S0021889811046188

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                    Zhao, Jinkui. 2011.  
        "SAAF: SANS data Analysis using Analytical Functions".  United States.  https://doi.org/10.1107/S0021889811046188.

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@article{osti_1092162,

  title        = {SAAF: SANS data Analysis using Analytical Functions},

  author       = {Zhao, Jinkui},

  abstractNote = {The recently completed Extended Q-Range Small Angle Scattering Diffractometer (EQ-SANS) has put the focus on its software needs with renewed urgency. In a series of efforts, we aim at providing a complete set of software solutions on the EQ-SANS instrument. These programs include initial data processing, data correction and reduction, analytical model fitting to the scattering data, Monte Carlo simulation for structure determination, and virtual instrument simulation for experiment planning. SAAF is one such program for analytical data modeling. It takes the reduced EQ-SANS data and allows users to fit the data to analytical models. These models are easy to write. They can either be user written, or from the pre-supplied model library.},

  doi          = {10.1107/S0021889811046188},

  url          = {https://www.osti.gov/biblio/1092162},
  journal      = {Journal of Applied Crystallography},

  issn         = {0021--8898},

  number       = 6,

  volume       = 44,

  place        = {United States},

  year         = {Sat Jan 01 00:00:00 EST 2011},

  month        = {Sat Jan 01 00:00:00 EST 2011}

}

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