Modulated microwave microscopy and probes used therewith
Abstract
A microwave microscope including a probe tip electrode vertically positionable over a sample and projecting downwardly from the end of a cantilever. A transmission line connecting the tip electrode to the electronic control system extends along the cantilever and is separated from a ground plane at the bottom of the cantilever by a dielectric layer. The probe tip may be vertically tapped near or at the sample surface at a low frequency and the microwave signal reflected from the tip/sample interaction is demodulated at the low frequency. Alternatively, a low-frequency electrical signal is also a non-linear electrical element associated with the probe tip to non-linearly interact with the applied microwave signal and the reflected non-linear microwave signal is detected at the low frequency. The non-linear element may be semiconductor junction formed near the apex of the probe tip or be an FET formed at the base of a semiconducting tip.
- Inventors:
- Publication Date:
- Research Org.:
- Leland Stanford Junior University (Stanford, CA)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1078319
- Patent Number(s):
- 8,266,718
- Application Number:
- 12/706,190
- Assignee:
- The Board of Trustees of Leland Stanford Junior University (Stanford, CA)
- DOE Contract Number:
- FG033-01ER45929-A001; FG36-08GOU7994
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 47 OTHER INSTRUMENTATION
Citation Formats
Lai, Keji, Kelly, Michael, and Shen, Zhi-Xun. Modulated microwave microscopy and probes used therewith. United States: N. p., 2012.
Web.
Lai, Keji, Kelly, Michael, & Shen, Zhi-Xun. Modulated microwave microscopy and probes used therewith. United States.
Lai, Keji, Kelly, Michael, and Shen, Zhi-Xun. 2012.
"Modulated microwave microscopy and probes used therewith". United States. https://www.osti.gov/servlets/purl/1078319.
@article{osti_1078319,
title = {Modulated microwave microscopy and probes used therewith},
author = {Lai, Keji and Kelly, Michael and Shen, Zhi-Xun},
abstractNote = {A microwave microscope including a probe tip electrode vertically positionable over a sample and projecting downwardly from the end of a cantilever. A transmission line connecting the tip electrode to the electronic control system extends along the cantilever and is separated from a ground plane at the bottom of the cantilever by a dielectric layer. The probe tip may be vertically tapped near or at the sample surface at a low frequency and the microwave signal reflected from the tip/sample interaction is demodulated at the low frequency. Alternatively, a low-frequency electrical signal is also a non-linear electrical element associated with the probe tip to non-linearly interact with the applied microwave signal and the reflected non-linear microwave signal is detected at the low frequency. The non-linear element may be semiconductor junction formed near the apex of the probe tip or be an FET formed at the base of a semiconducting tip.},
doi = {},
url = {https://www.osti.gov/biblio/1078319},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Sep 11 00:00:00 EDT 2012},
month = {Tue Sep 11 00:00:00 EDT 2012}
}
Works referenced in this record:
Near-field microwave microscope with improved sensitivity and spatial resolution
journal, June 2003
- Tselev, Alexander; Anlage, Steven M.; Christen, Hans M.
- Review of Scientific Instruments, Vol. 74, Issue 6
Calibration of shielded microwave probes using bulk dielectrics
journal, September 2008
- Lai, K.; Kundhikanjana, W.; Kelly, M. A.
- Applied Physics Letters, Vol. 93, Issue 12