skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Performance of a 512 x 512 Gated CMOS Imager with a 250 ps Exposure Time

Conference ·
DOI:https://doi.org/10.1117/12.930150· OSTI ID:1054958

We describe the performance of a 512x512 gated CMOS read out integrated circuit (ROIC) with a 250 ps exposure time. A low-skew, H-tree trigger distribution system is used to locally generate individual pixel gates in each 8x8 neighborhood of the ROIC. The temporal width of the gate is voltage controlled and user selectable via a precision potentiometer. The gating implementation was first validated in optical tests of a 64x64 pixel prototype ROIC developed as a proof-of-concept during the early phases of the development program. The layout of the H-Tree addresses each quadrant of the ROIC independently and admits operation of the ROIC in two modes. If “common mode” triggering is used, the camera provides a single 512x512 image. If independent triggers are used, the camera can provide up to four 256x256 images with a frame separation set by the trigger intervals. The ROIC design includes small (sub-pixel) optical photodiode structures to allow test and characterization of the ROIC using optical sources prior to bump bonding. Reported test results were obtained using short pulse, second harmonic Ti:Sapphire laser systems operating at λ~ 400 nm at sub-ps pulse widths.

Research Organization:
Nevada Test Site (NTS), Mercury, NV (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
DOE Contract Number:
DE-AC52-06NA25946
OSTI ID:
1054958
Report Number(s):
DOE/NV/25946-1573
Resource Relation:
Conference: SPIE Optics + Photonics Conference; San Diego, California; August 14, 2012
Country of Publication:
United States
Language:
English

Similar Records

Nanosecond Gated CMOS Camera (NSGCC) ICD (Rev. 2.1)
Technical Report · Tue Jul 06 00:00:00 EDT 2021 · OSTI ID:1054958

A time digitizer CMOS gate-array with a 250 ps time resolution
Journal Article · Thu Feb 01 00:00:00 EST 1996 · IEEE Journal of Solid-State Circuits · OSTI ID:1054958

Interferometric investigation of sharp directional jets in an expanding laser plasma
Conference · Sun Dec 31 00:00:00 EST 1995 · OSTI ID:1054958