The electron spectro-microscopy beamline at National Synchrotron Light Source II: A wide photon energy range, micro-focusing beamlinefor photoelectron spectro-microscopies

Journal Article · Mon Feb 13 00:00:00 EST 2012 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.3681440· OSTI ID:1048204

Reininger, R; Hulbert, L; Johnson, P D; Sadowski, J T; Starr, D E; Chubar, O; Valla, T; Vescovo, E

A comprehensive optical design for a high-resolution, high-flux, wide-energy range, micro-focused beamline working in the vacuum ultraviolet and soft x-ray photon energy range is proposed. The beamline is to provide monochromatic radiation to three photoelectron microscopes: a full-field x-ray photoelectron emission microscope and two scanning instruments, one dedicated to angle resolved photoemission spectroscopy ({micro}-ARPES) and one for ambient pressure x-ray photoelectron spectroscopy and scanning photoelectron microscopy (AP-XPS/SPEM). Microfocusing is achieved with state of the art elliptical cylinders, obtaining a spot size of 1 {micro}m for ARPES and 0.5 {micro}m for AP-XPS/SPEM. A detailed ray tracing analysis quantitatively evaluates the overall beamline performances.

• Research Organization: Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source
• Sponsoring Organization: USDOE SC OFFICE OF SCIENCE (SC)
• DOE Contract Number: DE-AC02-98CH10886
• OSTI ID: 1048204
• Report Number(s): BNL-98159-2012-JA; RSINAK; 39KC02000; TRN: US1204150
• Journal Information: Review of Scientific Instruments, Vol. 83, Issue 2; ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
43 PARTICLE ACCELERATORS
DESIGN
ELECTRONS
EMISSION SPECTRA
ENERGY RANGE
MICROSCOPES
MICROSCOPY
MONOCHROMATIC RADIATION
NSLS
PHOTOEMISSION
PHOTONS
SCANNING ELECTRON MICROSCOPY
SPECTRA
SPECTROSCOPY
X-RAY PHOTOELECTRON SPECTROSCOPY
X-RAY SPECTROSCOPY
ARPES
composition
surfaces
spectroscopy
national synchrotron light source