Multifrequency imaging in the intermittent contact mode of atomic force microscopy: beyond phase imaging

Journal Article · Sun Jan 01 00:00:00 EST 2012 · Nano Letters

DOI:https://doi.org/10.1002/smll.201101648· OSTI ID:1042837

Guo, Senli ^[1]; Mochalin, Vadym ^[2]; Neitzel, Ioannis ^[2]; Gogotsi, Yury G. ^[2]; Kalinin, Sergei V ^[1]; Jesse, Stephen ^[1]

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1. ORNL
2. Drexel University

Force-based scanning probe microscopies have emerged as a mainstay for probing structural and mechanical properties of materials on the nanometer and molecular scales. Despite tremendous progress achieved to date, the cantilever dynamics in single frequency scanning probe microscopies (SPM) is undefined due to having only two output variables. Here we demonstrate on diamond nanoparticles with different functionalization layers that the use of broad band detection by multiple frequency SPM allows complete information on tip-surface interactions in intermittent contact SPM to be acquired. The obtained data allows sub-3nm resolution even in ambient environment. By tuning the strength of tip-surface interaction, the information on surface state can be obtained.

• Research Organization: Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). National Center for Computational Sciences (NCCS)
• Sponsoring Organization: USDOE Office of Science (SC)
• DOE Contract Number: DE-AC05-00OR22725
• OSTI ID: 1042837
• Journal Information: Nano Letters, Vol. 8, Issue 8
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
77 NANOSCIENCE AND NANOTECHNOLOGY
ATOMIC FORCE MICROSCOPY
DETECTION
DIAMONDS
MECHANICAL PROPERTIES
PROBES
RESOLUTION
TUNING
Nanodiamond
Multifrequency imaging
generalized phase SPM (GP-SPM)