Synchronized Stress-strain Measurements in Dynamic Loading at High Pressure using D-DIA

Journal Article · Sat Dec 31 00:00:00 EST 2011 · Review of Scientific Instruments

OSTI ID:1042075

Li, L; Weidner, D

A new data collection protocol for forced oscillation experiments using a multianvil high pressure device is reported. We derive the stress of the sample at high pressure and temperature from synchrotron x-ray diffraction that is synchronized with sample strain measurements from x-ray radiographs. This method yields stress directly from the sample rather than a stress proxy. Furthermore, the diffraction pattern yields useful information concerning time evolution of structurally related phenomena. Here we illustrate some of these possibilities with high pressure experimental data.

• Research Organization: Brookhaven National Lab. (BNL), Upton, NY (United States)
• Sponsoring Organization: USDOE SC OFFICE OF SCIENCE (SC)
• DOE Contract Number: DE-AC02-98CH10886
• OSTI ID: 1042075
• Report Number(s): BNL-97753-2012-JA; RSINAK; TRN: US201212%%486
• Journal Information: Review of Scientific Instruments, Vol. 81, Issue 9; ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

99 GENERAL AND MISCELLANEOUS//MATHEMATICS, COMPUTING, AND INFORMATION SCIENCE
DIFFRACTION
IMAGES
OSCILLATIONS
STRAINS
SYNCHROTRONS
X-RAY DIFFRACTION