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Title: Quadriwave Lateral Shearing Interferometry in an Achromatic and Continuously Self-imaging Regime for Future X-ray Phase Imaging

Journal Article · · Optics Letters
DOI:https://doi.org/10.1364/OL.36.001398· OSTI ID:1042048

We present in this Letter a type of quadriwave lateral shearing interferometer for x-ray phase imaging. This device is based on a phase chessboard, and we take advantage of the large spectrum of the source to produce interferograms with a propagation-invariant contrast. Such a grating has been created for hard x-ray interferometry and experimentally tested on a synchrotron beamline at Soleil.

Research Organization:
Brookhaven National Lab. (BNL), Upton, NY (United States)
Sponsoring Organization:
USDOE SC OFFICE OF SCIENCE (SC)
DOE Contract Number:
DE-AC02-98CH10886
OSTI ID:
1042048
Report Number(s):
BNL-97726-2012-JA; OPLEDP; TRN: US201212%%459
Journal Information:
Optics Letters, Vol. 36, Issue 8; ISSN 0146-9592
Country of Publication:
United States
Language:
English