Structure-property Relationships for Methyl-terminated Alkyl Self-assembled Monolayers
Abstract
Structure-property relationships for methyl-terminated alkyl self-assembled monolayers (SAMs) are developed using near-edge X-ray absorption fine structure (NEXAFS) spectroscopy and atomic force microscopy (AFM). NEXAFS C K-edge spectra are used to compute the dichroic ratio, which provides a quantitative measure of the molecular structure. AFM data are analyzed with an elastic adhesive contact model, modified by a first-order elastic perturbation method to include substrate effects, to extract the monolayer mechanical properties. Using this approach, the measured mechanical properties are not influenced by the substrate, which allows universal structure-property relationships to be developed for methyl-terminated alkyl SAMs.
- Authors:
- Publication Date:
- Research Org.:
- Brookhaven National Lab. (BNL), Upton, NY (United States)
- Sponsoring Org.:
- USDOE SC OFFICE OF SCIENCE (SC)
- OSTI Identifier:
- 1041831
- Report Number(s):
- BNL-97509-2012-JA
Journal ID: ISSN 0009-2614; CHPLBC; TRN: US201212%%243
- DOE Contract Number:
- DE-AC02-98CH10886
- Resource Type:
- Journal Article
- Journal Name:
- Chemical Physics Letters
- Additional Journal Information:
- Journal Volume: 512; Journal Issue: 4-6; Journal ID: ISSN 0009-2614
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 37 INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; ABSORPTION SPECTROSCOPY; ADHESIVES; ATOMIC FORCE MICROSCOPY; DATA; DISTURBANCES; FINE STRUCTURE; MECHANICAL PROPERTIES; MOLECULAR STRUCTURE; SPECTRA; SPECTROSCOPY; SUBSTRATES
Citation Formats
DelRio, F, Rampulla, D, Jaye, C, Stan, G, Gates, R, Fischer, D, and Cook, R. Structure-property Relationships for Methyl-terminated Alkyl Self-assembled Monolayers. United States: N. p., 2011.
Web. doi:10.1016/j.cplett.2011.07.045.
DelRio, F, Rampulla, D, Jaye, C, Stan, G, Gates, R, Fischer, D, & Cook, R. Structure-property Relationships for Methyl-terminated Alkyl Self-assembled Monolayers. United States. https://doi.org/10.1016/j.cplett.2011.07.045
DelRio, F, Rampulla, D, Jaye, C, Stan, G, Gates, R, Fischer, D, and Cook, R. 2011.
"Structure-property Relationships for Methyl-terminated Alkyl Self-assembled Monolayers". United States. https://doi.org/10.1016/j.cplett.2011.07.045.
@article{osti_1041831,
title = {Structure-property Relationships for Methyl-terminated Alkyl Self-assembled Monolayers},
author = {DelRio, F and Rampulla, D and Jaye, C and Stan, G and Gates, R and Fischer, D and Cook, R},
abstractNote = {Structure-property relationships for methyl-terminated alkyl self-assembled monolayers (SAMs) are developed using near-edge X-ray absorption fine structure (NEXAFS) spectroscopy and atomic force microscopy (AFM). NEXAFS C K-edge spectra are used to compute the dichroic ratio, which provides a quantitative measure of the molecular structure. AFM data are analyzed with an elastic adhesive contact model, modified by a first-order elastic perturbation method to include substrate effects, to extract the monolayer mechanical properties. Using this approach, the measured mechanical properties are not influenced by the substrate, which allows universal structure-property relationships to be developed for methyl-terminated alkyl SAMs.},
doi = {10.1016/j.cplett.2011.07.045},
url = {https://www.osti.gov/biblio/1041831},
journal = {Chemical Physics Letters},
issn = {0009-2614},
number = 4-6,
volume = 512,
place = {United States},
year = {Sat Dec 31 00:00:00 EST 2011},
month = {Sat Dec 31 00:00:00 EST 2011}
}
Other availability
Save to My Library
You must Sign In or Create an Account in order to save documents to your library.