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Title: Structure-property Relationships for Methyl-terminated Alkyl Self-assembled Monolayers

Abstract

Structure-property relationships for methyl-terminated alkyl self-assembled monolayers (SAMs) are developed using near-edge X-ray absorption fine structure (NEXAFS) spectroscopy and atomic force microscopy (AFM). NEXAFS C K-edge spectra are used to compute the dichroic ratio, which provides a quantitative measure of the molecular structure. AFM data are analyzed with an elastic adhesive contact model, modified by a first-order elastic perturbation method to include substrate effects, to extract the monolayer mechanical properties. Using this approach, the measured mechanical properties are not influenced by the substrate, which allows universal structure-property relationships to be developed for methyl-terminated alkyl SAMs.

Authors:
; ; ; ; ; ;
Publication Date:
Research Org.:
Brookhaven National Lab. (BNL), Upton, NY (United States)
Sponsoring Org.:
USDOE SC OFFICE OF SCIENCE (SC)
OSTI Identifier:
1041831
Report Number(s):
BNL-97509-2012-JA
Journal ID: ISSN 0009-2614; CHPLBC; TRN: US201212%%243
DOE Contract Number:  
DE-AC02-98CH10886
Resource Type:
Journal Article
Journal Name:
Chemical Physics Letters
Additional Journal Information:
Journal Volume: 512; Journal Issue: 4-6; Journal ID: ISSN 0009-2614
Country of Publication:
United States
Language:
English
Subject:
37 INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; ABSORPTION SPECTROSCOPY; ADHESIVES; ATOMIC FORCE MICROSCOPY; DATA; DISTURBANCES; FINE STRUCTURE; MECHANICAL PROPERTIES; MOLECULAR STRUCTURE; SPECTRA; SPECTROSCOPY; SUBSTRATES

Citation Formats

DelRio, F, Rampulla, D, Jaye, C, Stan, G, Gates, R, Fischer, D, and Cook, R. Structure-property Relationships for Methyl-terminated Alkyl Self-assembled Monolayers. United States: N. p., 2011. Web. doi:10.1016/j.cplett.2011.07.045.
DelRio, F, Rampulla, D, Jaye, C, Stan, G, Gates, R, Fischer, D, & Cook, R. Structure-property Relationships for Methyl-terminated Alkyl Self-assembled Monolayers. United States. https://doi.org/10.1016/j.cplett.2011.07.045
DelRio, F, Rampulla, D, Jaye, C, Stan, G, Gates, R, Fischer, D, and Cook, R. 2011. "Structure-property Relationships for Methyl-terminated Alkyl Self-assembled Monolayers". United States. https://doi.org/10.1016/j.cplett.2011.07.045.
@article{osti_1041831,
title = {Structure-property Relationships for Methyl-terminated Alkyl Self-assembled Monolayers},
author = {DelRio, F and Rampulla, D and Jaye, C and Stan, G and Gates, R and Fischer, D and Cook, R},
abstractNote = {Structure-property relationships for methyl-terminated alkyl self-assembled monolayers (SAMs) are developed using near-edge X-ray absorption fine structure (NEXAFS) spectroscopy and atomic force microscopy (AFM). NEXAFS C K-edge spectra are used to compute the dichroic ratio, which provides a quantitative measure of the molecular structure. AFM data are analyzed with an elastic adhesive contact model, modified by a first-order elastic perturbation method to include substrate effects, to extract the monolayer mechanical properties. Using this approach, the measured mechanical properties are not influenced by the substrate, which allows universal structure-property relationships to be developed for methyl-terminated alkyl SAMs.},
doi = {10.1016/j.cplett.2011.07.045},
url = {https://www.osti.gov/biblio/1041831}, journal = {Chemical Physics Letters},
issn = {0009-2614},
number = 4-6,
volume = 512,
place = {United States},
year = {Sat Dec 31 00:00:00 EST 2011},
month = {Sat Dec 31 00:00:00 EST 2011}
}