Spectroscopic imaging in electron microscopy

Journal Article · Sun Jan 01 00:00:00 EST 2012 · MRS Bulletin

DOI:https://doi.org/10.1557/mrs.2011.332· OSTI ID:1035538

Pennycook, Stephen J ^[1]; Colliex, C. ^[2]

---

1. ORNL
2. Universite Paris Sud, Orsay, France

In the scanning transmission electron microscope, multiple signals can be simultaneously collected, including the transmitted and scattered electron signals (bright field and annular dark field or Z-contrast images), along with spectroscopic signals such as inelastically scattered electrons and emitted photons. In the last few years, the successful development of aberration correctors for the electron microscope has transformed the field of electron microscopy, opening up new possibilities for correlating structure to functionality. Aberration correction not only allows for enhanced structural resolution with incident probes into the sub-angstrom range, but can also provide greater probe currents to facilitate mapping of intrinsically weak spectroscopic signals at the nanoscale or even the atomic level. In this issue of MRS Bulletin, we illustrate the power of the new generation of electron microscopes with a combination of imaging and spectroscopy. We show the mapping of elemental distributions at atomic resolution and also the mapping of electronic and optical properties at unprecedented spatial resolution, with applications ranging from graphene to plasmonic nanostructures, and oxide interfaces to biology.

• Research Organization: Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
• Sponsoring Organization: USDOE Office of Science (SC)
• DOE Contract Number: DE-AC05-00OR22725
• OSTI ID: 1035538
• Journal Information: MRS Bulletin, Vol. 37, Issue 1; ISSN 0883-7694
• Country of Publication: United States
• Language: English

Related Subjects

72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS
77 NANOSCIENCE AND NANOTECHNOLOGY
BIOLOGY
CHEMICAL COMPOSITION
ELECTRON MICROSCOPES
ELECTRON MICROSCOPY
ELECTRONS
ENERGY-LOSS SPECTROSCOPY
NANOSTRUCTURES
OPENINGS
OPTICAL PROPERTIES
OXIDES
PHOTONS
PROBES
RESOLUTION
SPATIAL RESOLUTION
SPECTROSCOPY
TRANSMISSION ELECTRON MICROSCOPY