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Title: Microstructure dependence of the c-axis critical current density in second-generation YBCO tapes.

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.3653292· OSTI ID:1033871

C-axis current flow in high temperature superconductor (HTS) tape-shaped wires arises in configurations where the local wire axis is not perpendicular to the local magnetic field, such as in power cables with helically wound HTS tapes. The c-axis critical current density J{sub c}{sup c} has been recently found to be orders of magnitude lower than the ab-plane critical current density J{sub c}{sup ab}. Here we report on J{sub c}{sup c} (77 K, sf) values of various YBa{sub 2}Cu{sub 3}O{sub 7}-based (YBCO) tapes with different microstructures. Our results show that the value of J{sub c}{sup c} (77 K, sf) decreases significantly with increasing concentration of ab-plane stacking faults in YBCO thin films and that the critical current anisotropy {gamma} = J{sub c}{sup ab}/J{sub c}{sup c} can reach values as high as 2070, implying that in the highest-anisotropy tape, {approx}20% of the tape width carries c-axis current in a helically wound power cable.

Research Organization:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Organization:
USDOE Office of Science (SC); ENERGY FRONTIER RESEARCH CENTER - CENTER FOR EMERG
DOE Contract Number:
DE-AC02-06CH11357
OSTI ID:
1033871
Report Number(s):
ANL/MSD/JA-71891; JAPIAU; TRN: US201203%%149
Journal Information:
Journal of Applied Physics, Vol. 110, Issue 8; ISSN 0021-8979
Country of Publication:
United States
Language:
ENGLISH

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