skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Shock margin testing of a one-axis MEMS accelerometer.

Abstract

Shock testing was performed on a selected commercial-off-the-shelf - MicroElectroMechanical System (COTS-MEMS) accelerometer to determine the margin between the published absolute maximum rating for shock and the 'measured' level where failures are observed. The purpose of this testing is to provide baseline data for isolating failure mechanisms under shock and environmental loading in a representative device used or under consideration for use within systems and assemblies of the DOD/DOE weapons complex. The specific device chosen for this study was the AD22280 model of the ADXL78 MEMS Accelerometer manufactured by Analog Devices Inc. This study focuses only on the shock loading response of the device and provides the necessary data for adding influence of environmental exposure to the reliability of this class of devices. The published absolute maximum rating for acceleration in any axis was 4000 G for this device powered or unpowered. Results from this study showed first failures at 8000 G indicating a margin of error of two. Higher shock level testing indicated that an in-plane, but off-axis acceleration was more damaging than one in the sense direction.

Authors:
; ;
Publication Date:
Research Org.:
Sandia National Laboratories (SNL), Albuquerque, NM, and Livermore, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1028884
Report Number(s):
SAND2009-3909
TRN: US201201%%34
DOE Contract Number:  
AC04-94AL85000
Resource Type:
Technical Report
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; ACCELERATION; ACCELEROMETERS; ENVIRONMENTAL EXPOSURE; RELIABILITY; TESTING; WEAPONS

Citation Formats

Parson, Ted Blair, Tanner, Danelle Mary, and Buchheit, Thomas Edward. Shock margin testing of a one-axis MEMS accelerometer.. United States: N. p., 2008. Web. doi:10.2172/1028884.
Parson, Ted Blair, Tanner, Danelle Mary, & Buchheit, Thomas Edward. Shock margin testing of a one-axis MEMS accelerometer.. United States. https://doi.org/10.2172/1028884
Parson, Ted Blair, Tanner, Danelle Mary, and Buchheit, Thomas Edward. 2008. "Shock margin testing of a one-axis MEMS accelerometer.". United States. https://doi.org/10.2172/1028884. https://www.osti.gov/servlets/purl/1028884.
@article{osti_1028884,
title = {Shock margin testing of a one-axis MEMS accelerometer.},
author = {Parson, Ted Blair and Tanner, Danelle Mary and Buchheit, Thomas Edward},
abstractNote = {Shock testing was performed on a selected commercial-off-the-shelf - MicroElectroMechanical System (COTS-MEMS) accelerometer to determine the margin between the published absolute maximum rating for shock and the 'measured' level where failures are observed. The purpose of this testing is to provide baseline data for isolating failure mechanisms under shock and environmental loading in a representative device used or under consideration for use within systems and assemblies of the DOD/DOE weapons complex. The specific device chosen for this study was the AD22280 model of the ADXL78 MEMS Accelerometer manufactured by Analog Devices Inc. This study focuses only on the shock loading response of the device and provides the necessary data for adding influence of environmental exposure to the reliability of this class of devices. The published absolute maximum rating for acceleration in any axis was 4000 G for this device powered or unpowered. Results from this study showed first failures at 8000 G indicating a margin of error of two. Higher shock level testing indicated that an in-plane, but off-axis acceleration was more damaging than one in the sense direction.},
doi = {10.2172/1028884},
url = {https://www.osti.gov/biblio/1028884}, journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Jul 01 00:00:00 EDT 2008},
month = {Tue Jul 01 00:00:00 EDT 2008}
}