Charge exchange recombination detection of low-Z and medium-Z impurities in the extreme UV using a digital lock-in technique
- General Atomics, San Diego
- General Atomics
- ORNL
- CEA Cadarache, St. Paul lex Durance, France
- University of California, San Diego
More sensitive detection of charge exchange recombination lines from low-Z elements, and first-time detection from the medium-Z elements nickel and copper, has been achieved in DIII-D plasmas with a digital lock-in technique. That portion of the extreme UV spectrum varying synchronously in time with the square-wave modulation of a high energy, neutral heating beam is extracted by forming a scalar product of a correlation function with the data record of each pixel in the linear array detector. The usual, dense array of collisionally excited, metallic lines from the tokamak plasma is strongly suppressed, leaving only a sparse spectrum of lines dominated by charge exchange recombination transitions from fully stripped, low-Z elements. In plasmas with high metal content, charge exchange recombination lines from the Li-like ions of nickel and copper have been positively identified.
- Research Organization:
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC)
- DOE Contract Number:
- DE-AC05-00OR22725
- OSTI ID:
- 1025860
- Journal Information:
- Review of Scientific Instruments, Vol. 81, Issue 10; ISSN 0034-6748
- Country of Publication:
- United States
- Language:
- English
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