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Title: Measurement of Electron Beam Polarization from Unstrained Bulk GaAs via Two Photon Photoemission

Conference · · J. Phys.: Conf. Ser.

This paper describes measurements of the beam polarization and quantum efficiency for photoemission using two-photon excitation from unstrained bulk GaAs illuminated with pulsed, high intensity 1560nm laser light. Quantum efficiency is linearly proportional to 1560nm peak laser intensity, which was varied in three independent ways, indicating that the emitted electrons are promoted from the valence to the conduction band via two-photon absorption. Beam polarization was measured using a microMott polarimeter, with a value of 16.8(4)% polarization at 1560nm, which is roughly half the measured value of 33.4(8)% using 778 nm light.

Research Organization:
Thomas Jefferson National Accelerator Facility (TJNAF), Newport News, VA (United States)
Sponsoring Organization:
USDOE Office of Science (SC)
DOE Contract Number:
AC05-06OR23177
OSTI ID:
1021387
Report Number(s):
JLAB-ACC-10-1308; DOE/OR/23177-1665; TRN: US201116%%741
Journal Information:
J. Phys.: Conf. Ser., Vol. 298, Issue 01; Conference: PESP2010, 21–24, September 2010, Bonn, Germany
Country of Publication:
United States
Language:
English

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