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Title: Synchrotron X-Ray Topography Study of Structural Defects and Strain in Epitaxial Structures of Yb- and Tm-Doped Potassium Rare-Earth Double Tungstates and Their Influence on Laser Performance.

Journal Article · · Journal of Electronic Materials

Monoclinic potassium rare-earth double tungstates [KRE(WO{sub 4}){sub 2}, RE = Y, Lu, Yb; KREW] are well suited as hosts for active lanthanide ion (Ln{sup 3+}) dopants for diode-pumped solid-state lasers, with particular interest in thin-disk laser configurations when they are grown as thin films. Using synchrotron white-beam x-ray topography, we have imaged defects and strain in top-seeded solution-grown (TSSG) bulk substrates of different rare-earth tungstates as well as within Yb{sup 3+}- and Tm{sup 3+}-doped epitaxies for thin-disk laser applications grown on these substrates by liquid-phase epitaxy. Higher structural stress in Yb:KYW/KYW epitaxies compared with Yb:KLuW/KLuW epitaxies is found to lower efficiency in laser operation. The quality of Tm:KLuW/KLuW epitaxial films is sensitive to doping level, film thickness, and growth rate. Inhomogeneous stresses within the layers are dominated by lattice-mismatch effects rather than by crystallographic anisotropy.

Research Organization:
Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source
Sponsoring Organization:
DOE - OFFICE OF SCIENCE
DOE Contract Number:
DE-AC02-98CH10886
OSTI ID:
1020069
Report Number(s):
BNL-95917-2011-JA; JECMA5; TRN: US201116%%52
Journal Information:
Journal of Electronic Materials, Vol. 39, Issue 6; ISSN 0361-5235
Country of Publication:
United States
Language:
English