Synchrotron X-Ray Topography Study of Structural Defects and Strain in Epitaxial Structures of Yb- and Tm-Doped Potassium Rare-Earth Double Tungstates and Their Influence on Laser Performance.
Monoclinic potassium rare-earth double tungstates [KRE(WO{sub 4}){sub 2}, RE = Y, Lu, Yb; KREW] are well suited as hosts for active lanthanide ion (Ln{sup 3+}) dopants for diode-pumped solid-state lasers, with particular interest in thin-disk laser configurations when they are grown as thin films. Using synchrotron white-beam x-ray topography, we have imaged defects and strain in top-seeded solution-grown (TSSG) bulk substrates of different rare-earth tungstates as well as within Yb{sup 3+}- and Tm{sup 3+}-doped epitaxies for thin-disk laser applications grown on these substrates by liquid-phase epitaxy. Higher structural stress in Yb:KYW/KYW epitaxies compared with Yb:KLuW/KLuW epitaxies is found to lower efficiency in laser operation. The quality of Tm:KLuW/KLuW epitaxial films is sensitive to doping level, film thickness, and growth rate. Inhomogeneous stresses within the layers are dominated by lattice-mismatch effects rather than by crystallographic anisotropy.
- Research Organization:
- Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source
- Sponsoring Organization:
- DOE - OFFICE OF SCIENCE
- DOE Contract Number:
- DE-AC02-98CH10886
- OSTI ID:
- 1020069
- Report Number(s):
- BNL-95917-2011-JA; JECMA5; TRN: US201116%%52
- Journal Information:
- Journal of Electronic Materials, Vol. 39, Issue 6; ISSN 0361-5235
- Country of Publication:
- United States
- Language:
- English
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