Deformation of Single Crystal Sample using D-DI Apparatus Coupled with Synchrotron X-rays: Insitu Stress and Strain Measurements at High Pressure and Temperature

Journal Article · Fri Jan 01 00:00:00 EST 2010 · Journal of Physics and Chemistry of Solids

DOI:https://doi.org/10.1016/j.jpcs.2010.03.005· OSTI ID:1019938

Girard, J; Chen, J; Raterron, P; Holyoke, C

We present a technique for high pressure and high temperature deformation experiment on single crystals, using the Deformation-DIA apparatus at the X17B2 beamline of the NSLS. While deformation experiments on polycrystalline samples using D-DIA in conjunction with synchrotrons have been previously reported, this technical paper focuses on single crystal application of the technique. Our single crystals are specifically oriented such that only [1 0 0] slip or [0 0 1] slip in (0 1 0) plane is allowed. Constant applied stress (sigma <300 MPa) and specimen strain rates were monitored using in situ time-resolved X-ray diffraction and radiography imaging, respectively. Rheological properties of each activated slip system in the crystals can be revealed using this technique. In this paper, we describe the principle of sample preparation (e.g. [1 1 0]c and [0 1 1]c orientations) to activate specific slip systems (i.e. [1 0 0](0 1 0) and [0 0 1](0 1 0), respectively), stress measurement and procedures of the deformation experiments.

• Research Organization: Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source
• Sponsoring Organization: DOE - OFFICE OF SCIENCE
• DOE Contract Number: DE-AC02-98CH10886
• OSTI ID: 1019938
• Report Number(s): BNL-95784-2011-JA; JPCSAW; TRN: US201115%%574
• Journal Information: Journal of Physics and Chemistry of Solids, Vol. 71, Issue 8; ISSN 0022-3697
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
37 INORGANIC
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
DEFORMATION
INORGANIC COMPOUNDS
MECHANICAL PROPERTIES
MONOCRYSTALS
SAMPLE PREPARATION
SLIP
STRAIN RATE
STRAINS
SYNCHROTRONS
X-RAY DIFFRACTION
national synchrotron light source