Single Frequency Characterization of a Commercial Resin

Conference · Thu Oct 01 00:00:00 EDT 2009

OSTI ID:1016631

Sauers, Isidor ^[1]; Tuncer, Enis ^[1]; Polizos, Georgios ^[2]; James, David Randy ^[1]; Ellis, Alvin R ^[1]; Pace, Marshall O ^[1]

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1. ORNL
2. Oak Ridge National Laboratory (ORNL)

Electrical impedance measurement methods are extensively utilized to characterize dielectric materials. There are not many inexpensive commercially available measurement systems for low frequencies. In this paper an impedance measurement method using an electrometer is presented. The method can be employed for frequencies lower than 100 mHz. To illustrate the usefulness of the presented method, an epoxy resin is characterized and the influence of thermal aging is investigated.

• Research Organization: Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
• Sponsoring Organization: OE USDOE - Office of Electric Transmission and Distribution
• DOE Contract Number: DE-AC05-00OR22725
• OSTI ID: 1016631
• Resource Relation: Conference: CEIDP: 2009 ANNUAL REPORT CONFERENCE ON ELECTRICAL INSULATION AND DIELECTRIC PHENOMENA, Virginia Beach, VA, USA, 20091018, 20091021
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
AGING
DIELECTRIC MATERIALS
ELECTRICAL INSULATION
ELECTROMETERS
IMPEDANCE
RESINS