Impact of Edge-Barrier Pinning in Superconducting Thin Films
It has been suggested that edge-barrier pinning might cause the critical current density (J{sub c}) in bridged superconducting films to increase. Subsequent work indicated that this edge-barrier effect does not impact bridges larger than 1 {micro}m. However, we provide a theoretical assessment with supporting experimental data suggesting edge-barrier pinning can significantly enhance J{sub c} for bridges of a few microns or even tens of microns thus skewing any comparisons among institutions. As such, when reporting flux pinning and superconductor processing improvements for J{sub c} comparisons, the width of the sample has to be taken into consideration as is currently done with film thickness.
- Research Organization:
- Ames Lab., Ames, IA (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC)
- DOE Contract Number:
- DE-AC02-07CH11358
- OSTI ID:
- 1014578
- Report Number(s):
- IS-J 7563; TRN: US1102628
- Journal Information:
- Applied Physics Letters, Vol. 97, Issue 26
- Country of Publication:
- United States
- Language:
- English
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