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Title: EVALUATION OF LOCAL STRAIN EVOLUTION FROM METALLIC WHISKER FORMATION

EVALUATION OF LOCAL STRAIN EVOLUTION FROM METALLIC WHISKER FORMATION Evolution of local strain on electrodeposited tin films upon aging has been monitored by digital image correlation (DIC) for the first time. Maps of principal strains adjacent to whisker locations were constructed via comparing pre- and post-growth scanning electron microscopy (SEM) images. Results showed that the magnitude of the strain gradient plays an important role in whisker growth. DIC visualized the dynamic growth process in which the alteration of strain field has been identified to cause growth of subsequent whiskers.
Authors: ;
Publication Date:
OSTI Identifier:1013351
Report Number(s):SRNL-STI-2011-00284
Journal ID: ISSN 1359-6462; SCMAF7; TRN: US201110%%534
DOE Contract Number:DE-AC09-08SR22470
Resource Type:Journal Article
Resource Relation:Journal Name: Scripta Materialia
Research Org:SRS
Sponsoring Org:DOE
Country of Publication:United States
Language:English
Subject: 36 MATERIALS SCIENCE; AGING; EVALUATION; STRAINS; WHISKERS; TIN; ELECTRODEPOSITION; CRYSTAL GROWTH