EVALUATION OF LOCAL STRAIN EVOLUTION FROM METALLIC WHISKER FORMATION
EVALUATION OF LOCAL STRAIN EVOLUTION FROM METALLIC WHISKER FORMATION Evolution of local strain on electrodeposited tin films upon aging has been monitored by digital image correlation (DIC) for the first time. Maps of principal strains adjacent to whisker locations were constructed via comparing pre- and post-growth scanning electron microscopy (SEM) images. Results showed that the magnitude of the strain gradient plays an important role in whisker growth. DIC visualized the dynamic growth process in which the alteration of strain field has been identified to cause growth of subsequent whiskers.
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