Polychromatic X-ray Microdiffraction Characterization of Local Crystallographic Structure and Defect Distributions
Abstract
Three-dimensional (3D), nondestructive, spatially resolved characterization of local crystal structure is conveniently made with polychromatic x-ray microdiffraction. In general, polychromatic microdiffraction provides information about the local (subgrain) orientation, unpaired-dislocation density, and elastic strain. This information can be used for direct comparison to theoretical models. Practical microbeams use intense synchrotron x-ray sources and advanced x-ray focusing optics. By employing polychromatic x-ray beams and a virtual pinhole camera method, called differential aperture microscopy, 3D distributions of the local crystalline phase, orientation (texture), and elastic and plastic strain tensors can be measured with submicron 3D resolution. The local elastic strain tensor elements can typically be determined with uncertainties less than 100 ppm. Orientations can be quantified to {approx} 0.01{sup o} and the local unpaired dislocation-density tensor can be simultaneously characterized. The spatial resolution limit for hard x-ray polychromatic microdiffraction is < 40nm and existing instruments operate with {approx} 500 to 1000nm resolution. Because the 3D x-ray crystal microscope is a penetrating nondestructive tool, it is ideal for studies of mesoscale evolution in materials.
- Authors:
-
- ORNL
- Publication Date:
- Research Org.:
- Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1008421
- Resource Type:
- Book
- Resource Relation:
- Related Information: Encyclopedia of Materials: Science and Technology
- Country of Publication:
- United States
- Language:
- ENGLISH
- Subject:
- 36 MATERIALS SCIENCE; 43 PARTICLE ACCELERATORS; APERTURES; CAMERAS; CRYSTAL STRUCTURE; DEFECTS; FOCUSING; MICROSCOPES; MICROSCOPY; OPTICS; ORIENTATION; PLASTICS; RESOLUTION; SPATIAL RESOLUTION; STRAINS; SYNCHROTRONS; TEXTURE; X-RAY SOURCES
Citation Formats
Ice, G E, Barabash, R I, and Pang, J.W. L. Polychromatic X-ray Microdiffraction Characterization of Local Crystallographic Structure and Defect Distributions. United States: N. p., 2007.
Web. doi:10.1016/B0-08-043152-6/02065-9.
Ice, G E, Barabash, R I, & Pang, J.W. L. Polychromatic X-ray Microdiffraction Characterization of Local Crystallographic Structure and Defect Distributions. United States. https://doi.org/10.1016/B0-08-043152-6/02065-9
Ice, G E, Barabash, R I, and Pang, J.W. L. 2007.
"Polychromatic X-ray Microdiffraction Characterization of Local Crystallographic Structure and Defect Distributions". United States. https://doi.org/10.1016/B0-08-043152-6/02065-9.
@article{osti_1008421,
title = {Polychromatic X-ray Microdiffraction Characterization of Local Crystallographic Structure and Defect Distributions},
author = {Ice, G E and Barabash, R I and Pang, J.W. L.},
abstractNote = {Three-dimensional (3D), nondestructive, spatially resolved characterization of local crystal structure is conveniently made with polychromatic x-ray microdiffraction. In general, polychromatic microdiffraction provides information about the local (subgrain) orientation, unpaired-dislocation density, and elastic strain. This information can be used for direct comparison to theoretical models. Practical microbeams use intense synchrotron x-ray sources and advanced x-ray focusing optics. By employing polychromatic x-ray beams and a virtual pinhole camera method, called differential aperture microscopy, 3D distributions of the local crystalline phase, orientation (texture), and elastic and plastic strain tensors can be measured with submicron 3D resolution. The local elastic strain tensor elements can typically be determined with uncertainties less than 100 ppm. Orientations can be quantified to {approx} 0.01{sup o} and the local unpaired dislocation-density tensor can be simultaneously characterized. The spatial resolution limit for hard x-ray polychromatic microdiffraction is < 40nm and existing instruments operate with {approx} 500 to 1000nm resolution. Because the 3D x-ray crystal microscope is a penetrating nondestructive tool, it is ideal for studies of mesoscale evolution in materials.},
doi = {10.1016/B0-08-043152-6/02065-9},
url = {https://www.osti.gov/biblio/1008421},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Wed Dec 19 00:00:00 EST 2007},
month = {Wed Dec 19 00:00:00 EST 2007}
}