Structural Environment of Nitrogen in N-doped Rutile TiO2(110)

Conference · Fri Dec 31 00:00:00 EST 2010

DOI:https://doi.org/10.1117/12.862297· OSTI ID:1007369

Henderson, Michael A; Shutthanandan, V; Ohsawa, Takeo; Chambers, Scott A

We employ x-ray photoelectron spectroscopy (XPS), reflection high-energy electron diffraction (RHEED) and nuclear reaction analysis (NRA) to characterize the concentration-dependent structural properties of nitrogen doping into rutile TiO2. High quality N-doped TiO2 were prepared on rutile single crystal TiO2(110) substrates using plasma-assisted molecular beam epitaxy with an electron cyclotron resonance (ECR) plasma and Ti effusive sources. Films with N dopant concentrations at or below 2 at.% exhibited predominately substitutional doping based on NRA data, whereas films with concentrations above this limit resulted in little or no substitutional N and surfaces rich in Ti3+. The binding energy of the N 1s feature in XPS did not readily distinguish between these two extremes in N-doping, rendering features within 0.4 eV of each other and similar peak profiles. Although widely used to characterize the state of N in anion-doped TiO2 materials, we find that XPS is unsuitable for this task.

• Research Organization: Pacific Northwest National Lab. (PNNL), Richland, WA (United States). Environmental Molecular Sciences Lab. (EMSL)
• Sponsoring Organization: USDOE
• DOE Contract Number: AC05-76RL01830
• OSTI ID: 1007369
• Report Number(s): PNNL-SA-73720; 35220; KC0301010; TRN: US1101307
• Resource Relation: Conference: Solar Hydrogen and Nanotechnology V, Proceedings of SPIE , 7770
• Country of Publication: United States
• Language: English

Related Subjects

08 HYDROGEN
36 MATERIALS SCIENCE
43 PARTICLE ACCELERATORS
BINDING ENERGY
ELECTRON CYCLOTRON-RESONANCE
ELECTRON DIFFRACTION
HYDROGEN
MOLECULAR BEAM EPITAXY
MONOCRYSTALS
NITROGEN
NUCLEAR REACTION ANALYSIS
PLASMA
REFLECTION
RUTILE
SUBSTRATES
X-RAY PHOTOELECTRON SPECTROSCOPY
Environmental Molecular Sciences Laboratory