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Title How Electron Spectroscopy with Synchrotron Light Can Help Us Understand High-Tc Superconductivity and Other Complex States of Matter
Speaker/Author Campuzano, Juan Carlos [University of Illinois, Chicago]
Publication Date2012 Mar 07
OSTI Identifier1042468
DOE Contract NumberDE-ACO2-06CH11357
Resource TypeConference
Resource RelationConference: APS Colloquium Series, Advanced Photon Source (APS) at Argonne National Laboratory, Argonne, Illinois (United States), presented on March 7, 2012
Research OrgANL (Argonne National Laboratory (ANL), Argonne, IL (United States))
Sponsoring OrgUSDOE Office of Science (SC)
Subject75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ANTIFERROMAGNETIC MATERIALS; CHARGE CARRIERS; CHARGE DENSITY; COPPER COMPOUNDS; COPPER IONS; CUPRATES; DIFFRACTION; DOMAIN STRUCTURE; DOPED MATERIALS; ELECTRONIC STRUCTURE; LAYERS; KINETIC ENERGY; OXIDES; SEGREGATION; SPIN; SUPERCONDUCTIVITY; HIGH-TC SUPERCONDUCTORS
Description/AbstractAll the physical, chemical, and mechanical properties of materials are controlled by electrons that occupy the highest energy levels in solids, those near the Fermi energy. Many techniques were developed to study those electrons, leading to the great successes of condensed matter physics. Newer and complex materials, such as the high-temperature superconductors, tend to exhibit very large anisotropies in their physical properties, requiring a more detailed knowledge of the behavior of electrons not only as a function of their energy, but also their momentum. Angle-resolved photoemission can contribute to our understanding by providing a great deal of information on many of the momentum-dependent properties of electrons and their interactions. In this talk, I will present a brief overview of how a long-term and focused collaboration between scientists at Argonne and other institutions has contributed to making angle-resolved photoemissions a most useful tool in the study of complex states of matter.
Country of PublicationUS
LanguageEnglish
FormatMedium: AV; Other: Run Time 00:45:57
System Entry Date2013 May 02

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