Variable magnification with Kirkpatrick-Baez optics for synchrotron X-ray microscopy

Jach, Terrence; Bakulin, Alex S.; Durbin, Stephen M.; Pedulla, Joseph; Macrander, Albert

doi:10.6028/jres.111.018

Title: Variable magnification with Kirkpatrick-Baez optics for synchrotron X-ray microscopy

Abstract

In this study, we describe the distinction between the operation of a short focal length x-ray microscope forming a real image with a laboratory source (convergent illumination) and with a highly collimated intense beam from a synchrotron light source (Kohler illumination).

Authors:

Jach, Terrence ^[1]; Bakulin, Alex S. ^[2]; Durbin, Stephen M. ^[2]; Pedulla, Joseph ^[3]; Macrander, Albert ^[4]

National Institute of Standards and Technology, Gaithersburg, MD (United States)
Purdue Univ., West Lafayette, IN (United States)
J. Pedulla Associates, Silver Springs, MD (United States)
Argonne National Lab. (ANL), Argonne, IL (United States)

Publication Date:: Mon May 01 00:00:00 EDT 2006

Research Org.:: Argonne National Laboratory (ANL), Argonne, IL (United States)

Sponsoring Org.:: USDOE

OSTI Identifier:: 898720

Grant/Contract Number:: AC02-06CH11357

Resource Type:: Accepted Manuscript

Journal Name:: Journal of Research of the National Institute of Standards and Technology

Additional Journal Information:: Journal Volume: 111; Journal Issue: 3; Journal ID: ISSN 1044-677X

Publisher:: National Institute of Standards (NIST)

Country of Publication:: United States

Language:: English

Subject:: 43 PARTICLE ACCELERATORS; MICROSCOPY; OPTICS; SYNCHROTRONS; advanced photon source

Citation Formats


                    Jach, Terrence, Bakulin, Alex S., Durbin, Stephen M., Pedulla, Joseph, and Macrander, Albert. Variable magnification with Kirkpatrick-Baez optics for synchrotron X-ray microscopy.  United States: N. p., 2006. 
Web.  doi:10.6028/jres.111.018.

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                    Jach, Terrence, Bakulin, Alex S., Durbin, Stephen M., Pedulla, Joseph, & Macrander, Albert. Variable magnification with Kirkpatrick-Baez optics for synchrotron X-ray microscopy.  United States.  https://doi.org/10.6028/jres.111.018

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                    Jach, Terrence, Bakulin, Alex S., Durbin, Stephen M., Pedulla, Joseph, and Macrander, Albert. Mon .  
"Variable magnification with Kirkpatrick-Baez optics for synchrotron X-ray microscopy".  United States.  https://doi.org/10.6028/jres.111.018.  https://www.osti.gov/servlets/purl/898720.

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@article{osti_898720,

  title        = {Variable magnification with Kirkpatrick-Baez optics for synchrotron X-ray microscopy},

  author       = {Jach, Terrence and Bakulin, Alex S. and Durbin, Stephen M. and Pedulla, Joseph and Macrander, Albert},

  abstractNote = {In this study, we describe the distinction between the operation of a short focal length x-ray microscope forming a real image with a laboratory source (convergent illumination) and with a highly collimated intense beam from a synchrotron light source (Kohler illumination).},

  doi          = {10.6028/jres.111.018},

  journal      = {Journal of Research of the National Institute of Standards and Technology},

  number       = 3,

  volume       = 111,

  place        = {United States},

  year         = {Mon May 01 00:00:00 EDT 2006},

  month        = {Mon May 01 00:00:00 EDT 2006}

}

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Journal Article:

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https://doi.org/10.6028/jres.111.018

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Works referenced in this record:

SHADOW: A synchrotron radiation and X-ray optics simulation tool
journal, August 1994

Welnak, C.; Chen, G. J.; Cerrina, F.
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 347, Issue 1-3
DOI: 10.1016/0168-9002(94)91906-2

A simple x−ray microscope for photographing laser produced plasmas
journal, February 1975

Seward, F. D.; Palmieri, T. M.
Review of Scientific Instruments, Vol. 46, Issue 2
DOI: 10.1063/1.1134167

Instrumental aspects of x-ray microbeams in the range above 1 keV
journal, April 1999

Dhez, P.; Chevallier, P.; Lucatorto, T. B.
Review of Scientific Instruments, Vol. 70, Issue 4
DOI: 10.1063/1.1149733

The Resolving Power of an X‐Ray Microscope
journal, July 1950

Prince, Edward
Journal of Applied Physics, Vol. 21, Issue 7
DOI: 10.1063/1.1699734

X-ray microscope with multilayer mirrors
journal, June 1986

Underwood, James H.; Barbee, Troy W.; Frieber, C.
Applied Optics, Vol. 25, Issue 11
DOI: 10.1364/ao.25.001730

Works referencing / citing this record:

Development of an adjustable Kirkpatrick-Baez microscope for laser driven x-ray sources
journal, June 2019

Zeraouli, G.; Gatti, G.; Longman, A.
Review of Scientific Instruments, Vol. 90, Issue 6
DOI: 10.1063/1.5091103

Development of an adjustable Kirkpatrick-Baez microscope for laser driven x-ray sources at CLPU
text, January 2018

Zeraouli, G.; gatti, G.; Longman, A.
arXiv
DOI: 10.48550/arxiv.1811.04762

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Similar Records

Title: Variable magnification with Kirkpatrick-Baez optics for synchrotron X-ray microscopy

Abstract

Citation Formats

SHADOW: A synchrotron radiation and X-ray optics simulation tool journal, August 1994

A simple x−ray microscope for photographing laser produced plasmas journal, February 1975

Instrumental aspects of x-ray microbeams in the range above 1 keV journal, April 1999

The Resolving Power of an X‐Ray Microscope journal, July 1950

X-ray microscope with multilayer mirrors journal, June 1986

Development of an adjustable Kirkpatrick-Baez microscope for laser driven x-ray sources journal, June 2019

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SHADOW: A synchrotron radiation and X-ray optics simulation tool
journal, August 1994

A simple x−ray microscope for photographing laser produced plasmas
journal, February 1975

Instrumental aspects of x-ray microbeams in the range above 1 keV
journal, April 1999

The Resolving Power of an X‐Ray Microscope
journal, July 1950

X-ray microscope with multilayer mirrors
journal, June 1986

Development of an adjustable Kirkpatrick-Baez microscope for laser driven x-ray sources
journal, June 2019

Development of an adjustable Kirkpatrick-Baez microscope for laser driven x-ray sources at CLPU
text, January 2018